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 Results for by van Smaalen, S.
Accurate electron densities
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E., International Tables for Crystallography (2019). Vol. H, Section 4.8.7.6, p. [ doi:10.1107/97809553602060000963 ]
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Disorder and anharmonic atomic displacements
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E., International Tables for Crystallography (2019). Vol. H, Section 4.8.7.5, p. [ doi:10.1107/97809553602060000963 ]
Bagautdinov, B., Luedecke, J., Schneider, M. & van Smaalen, S. (1998). Disorder in the crystal structure of Cs 2 HgCl 4 studied by the maximum entropy method. Acta Cryst. B 54, 626–634. Google Scholar Banno, H., Hanai, T., Asaka ...

Types of MEM-reconstructed electron-density distribution
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E., International Tables for Crystallography (2019). Vol. H, Section 4.8.7.1, p. [ doi:10.1107/97809553602060000963 ]
combined with histogram matching to solve complex crystal structures from powder diffraction data. Z. Kristallogr. 222, 47–53. Google Scholar Samy, A., Dinnebier, R. E., van Smaalen, S. & Jansen, M. (2010). Maximum entropy method ...

Combination of MEM and Rietveld refinement (REMEDY cycle)
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E., International Tables for Crystallography (2019). Vol. H, Section 4.8.7.3, p. [ doi:10.1107/97809553602060000963 ]
diffraction. Angew. Chem. Int. Ed. 45, 4932–4936. Google Scholar Magdysyuk, O. V., Dinnebier, R. E., van Smaalen, S., Zykin, M. A., Kazin, P. E. & Jansen, M. (2012). Reconstructions of electron density by the maximum entropy method from X ...

MEM-assisted structure solution by charge flipping
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E., International Tables for Crystallography (2019). Vol. H, Section 4.8.7.4, p. [ doi:10.1107/97809553602060000963 ]
of the maximum-entropy method to powder-diffraction data As discussed in Section 4.8.7.2, reflection phases from charge flipping can be used for a complete ab initio determination of the electron density of ordered and disordered ...

MEM-based improvement of the structure model from charge flipping
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E., International Tables for Crystallography (2019). Vol. H, Section 4.8.7.2, p. [ doi:10.1107/97809553602060000963 ]
in Section 4.8.7.1 ] leads to a similar density but with distinct differences that can be described as a smoother distribution of the densities of the anions (Fig. 4.8.7). Three more MEM density maps of decreasing model bias are presented in Fig. 4.8.7 ...

Analysis of the electron-density distribution from powder-diffraction data
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E., International Tables for Crystallography (2019). Vol. H, Section 4.8.7, p. [ doi:10.1107/97809553602060000963 ]
with F constraints based on F obs with φ calc [type (2) in Section 4.8.7.1 ] leads to a similar density but with distinct differences that can be described as a smoother distribution of the densities of the anions (Fig. 4.8.7 ...

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