Angle-dispersive diffractometer methods: synchrotron sources
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.5,
pp. 495-496
[ doi:10.1107/97809553602060000596 ]
Intensity standards
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.11,
pp. 500-500
[ doi:10.1107/97809553602060000596 ]
Camera methods
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.8,
pp. 497-498
[ doi:10.1107/97809553602060000596 ]
Testing for remanent systematic error
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.9,
pp. 498-498
[ doi:10.1107/97809553602060000596 ]
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Powder-diffraction standards
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.10,
pp. 498-499
[ doi:10.1107/97809553602060000596 ]
Instrumental line-profile-shape standards
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.12,
pp. 501-501
[ doi:10.1107/97809553602060000596 ]
Measurement of refractive index
Larsen, E. S. Jr,
Meyrowitz, R. and
Wilson, A. J. C.,
International Tables for Crystallography
(2006).
Vol. C,
ch. 3.3,
pp. 160-161
[ doi:10.1107/97809553602060000587 ]
High-index media
Larsen, E. S. Jr,
Meyrowitz, R. and
Wilson, A. J. C.,
International Tables for Crystallography
(2006).
Vol. C,
Section 3.3.3,
pp. 160-161
[ doi:10.1107/97809553602060000587 ]
Media for organic substances
Larsen, E. S. Jr,
Meyrowitz, R. and
Wilson, A. J. C.,
International Tables for Crystallography
(2006).
Vol. C,
Section 3.3.4,
pp. 161-161
[ doi:10.1107/97809553602060000587 ]
Introduction
Larsen, E. S. Jr,
Meyrowitz, R. and
Wilson, A. J. C.,
International Tables for Crystallography
(2006).
Vol. C,
Section 3.3.1,
pp. 160-160
[ doi:10.1107/97809553602060000587 ]