modify your search
Results for DC.creator="J." AND DC.creator="Zhang" in section 2.4.3 of volume H |
Diffraction data collection, processing and calibration
International Tables for Crystallography (2019). Vol. H, Section 2.4.3.4, pp. 107-108 [ doi:10.1107/97809553602060000939 ]
... with a digital detector is given by where g(i, j) is the detector gain image, H is the PSF of ... electron beams originally received by the detector. The i and j are the pixel coordinates of the detector. The PSF is ... edited by L. Reimer, pp. 43-149. Berlin: Springer.GoogleScholar Zuo, J. M. (2000). Electron detection characteristics of a slow- ...
Sample preparation
International Tables for Crystallography (2019). Vol. H, Section 2.4.3.3, pp. 106-107 [ doi:10.1107/97809553602060000939 ]
... Handbook of Microscopy, edited by S. Amelinckx, D. van Dyck, J. van Landuyt & G. van Tendeloo, Vol. 3, pp. 751-801. ... the Electron Microscope. New York: Plenum Press.GoogleScholar Lábár, J. L. & Egerton, R. (1999). Special issue on ion beam techniques. Micron, 30, 195-196.GoogleScholar Orloff, J., Swanson, L. & Utlaut, M. (2002). High Resolution Focused ...
Nano-area electron diffraction (NAED)
International Tables for Crystallography (2019). Vol. H, Section 2.4.3.2, pp. 105-106 [ doi:10.1107/97809553602060000939 ]
... the electron diffraction pattern from the surrounding materials. References Zuo, J. M., Gao, M., Tao, J., Li, B. Q., Twesten, R. & Petrov, I. (2004). Coherent ...
Selected-area electron diffraction (SAED)
International Tables for Crystallography (2019). Vol. H, Section 2.4.3.1, p. 105 [ doi:10.1107/97809553602060000939 ]
Selected-area electron diffraction (SAED) 2.4.3.1. Selected-area electron diffraction (SAED) SAED is formed using the transmission electron microscope illumination, which is spread out over a large area of the specimen to minimize the beam convergence angle. The diffraction pattern is first formed at the back focal plane of the objective ...
Electron powder diffraction techniques
International Tables for Crystallography (2019). Vol. H, Section 2.4.3, pp. 105-108 [ doi:10.1107/97809553602060000939 ]
... with a digital detector is given by where g(i, j) is the detector gain image, H is the PSF of ... electron beams originally received by the detector. The i and j are the pixel coordinates of the detector. The PSF is ... Handbook of Microscopy, edited by S. Amelinckx, D. van Dyck, J. van Landuyt & G. van Tendeloo, Vol. 3, pp. 751- ...
International Tables for Crystallography (2019). Vol. H, Section 2.4.3.4, pp. 107-108 [ doi:10.1107/97809553602060000939 ]
... with a digital detector is given by where g(i, j) is the detector gain image, H is the PSF of ... electron beams originally received by the detector. The i and j are the pixel coordinates of the detector. The PSF is ... edited by L. Reimer, pp. 43-149. Berlin: Springer.GoogleScholar Zuo, J. M. (2000). Electron detection characteristics of a slow- ...
Sample preparation
International Tables for Crystallography (2019). Vol. H, Section 2.4.3.3, pp. 106-107 [ doi:10.1107/97809553602060000939 ]
... Handbook of Microscopy, edited by S. Amelinckx, D. van Dyck, J. van Landuyt & G. van Tendeloo, Vol. 3, pp. 751-801. ... the Electron Microscope. New York: Plenum Press.GoogleScholar Lábár, J. L. & Egerton, R. (1999). Special issue on ion beam techniques. Micron, 30, 195-196.GoogleScholar Orloff, J., Swanson, L. & Utlaut, M. (2002). High Resolution Focused ...
Nano-area electron diffraction (NAED)
International Tables for Crystallography (2019). Vol. H, Section 2.4.3.2, pp. 105-106 [ doi:10.1107/97809553602060000939 ]
... the electron diffraction pattern from the surrounding materials. References Zuo, J. M., Gao, M., Tao, J., Li, B. Q., Twesten, R. & Petrov, I. (2004). Coherent ...
Selected-area electron diffraction (SAED)
International Tables for Crystallography (2019). Vol. H, Section 2.4.3.1, p. 105 [ doi:10.1107/97809553602060000939 ]
Selected-area electron diffraction (SAED) 2.4.3.1. Selected-area electron diffraction (SAED) SAED is formed using the transmission electron microscope illumination, which is spread out over a large area of the specimen to minimize the beam convergence angle. The diffraction pattern is first formed at the back focal plane of the objective ...
Electron powder diffraction techniques
International Tables for Crystallography (2019). Vol. H, Section 2.4.3, pp. 105-108 [ doi:10.1107/97809553602060000939 ]
... with a digital detector is given by where g(i, j) is the detector gain image, H is the PSF of ... electron beams originally received by the detector. The i and j are the pixel coordinates of the detector. The PSF is ... Handbook of Microscopy, edited by S. Amelinckx, D. van Dyck, J. van Landuyt & G. van Tendeloo, Vol. 3, pp. 751- ...
powered by |