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 Results for DC.creator="K." AND DC.creator="Knorr" in section 3.9.3 of volume H
QPA methodology
Madsen, I., Scarlett, N., Kleeberg, R. and Knorr, K.  International Tables for Crystallography (2019). Vol. H, Section 3.9.3, pp. 345-350 [ doi:10.1107/97809553602060000954 ]
... Hill, 1991 ; Hill & Howard, 1987 ; O'Connor & Raven, 1988 ) where K is an `experiment constant' used to put W[alpha] on ... Connor & Raven (1988 ) and Bish & Howard (1988 ) have shown that K is dependent only on the instrumental conditions and is independent ... related parameters. Therefore a single measurement is sufficient to determine K for a given instrument configuration and set of data- ...

Full-pattern fitting methods
Madsen, I., Scarlett, N., Kleeberg, R. and Knorr, K.  International Tables for Crystallography (2019). Vol. H, Section 3.9.3.5, p. 348 [ doi:10.1107/97809553602060000954 ]
... File Report 2003-78. http://pubs.er.usgs.gov/publication/ofr200378.GoogleScholar Smith, D. K., Johnson, G. G., Scheible, A., Wims, A. M., Johnson, J. ...

Matrix-flushing method
Madsen, I., Scarlett, N., Kleeberg, R. and Knorr, K.  International Tables for Crystallography (2019). Vol. H, Section 3.9.3.4, pp. 347-348 [ doi:10.1107/97809553602060000954 ]
Matrix-flushing method 3.9.3.4. Matrix-flushing method An important feature of RIR-based techniques is that, once the RIRs are determined for the analyte phases of interest, the standard phase does not need to be present in the sample. The effect of the sample mass absorption coefficient is also removed by ...

Reference intensity ratio methods
Madsen, I., Scarlett, N., Kleeberg, R. and Knorr, K.  International Tables for Crystallography (2019). Vol. H, Section 3.9.3.3, p. 347 [ doi:10.1107/97809553602060000954 ]
... 63-71.GoogleScholar Hubbard, C. R., Evans, E. H. & Smith, D. K. (1976). The reference intensity ratio, I/Ic, for computer ... in quantitative XRD. Powder Diffr. 3, 74-77.GoogleScholar Smith, D. K., Johnson, G. G., Scheible, A., Wims, A. M., Johnson, J. ...

Selection of an internal standard
Madsen, I., Scarlett, N., Kleeberg, R. and Knorr, K.  International Tables for Crystallography (2019). Vol. H, Section 3.9.3.2.1, pp. 346-347 [ doi:10.1107/97809553602060000954 ]
Selection of an internal standard 3.9.3.2.1. Selection of an internal standard The selection of an appropriate material for use as an internal standard for QPA is not always straightforward. Ideally, the material selected should: (1) Have a simple diffraction pattern resulting in minimal overlap with peaks of interest in the sample. ...

Internal standard method
Madsen, I., Scarlett, N., Kleeberg, R. and Knorr, K.  International Tables for Crystallography (2019). Vol. H, Section 3.9.3.2, pp. 346-347 [ doi:10.1107/97809553602060000954 ]
Internal standard method 3.9.3.2. Internal standard method A more general, and experimentally simpler, approach is to eliminate from the analysis altogether via the inclusion of an internal standard s in known weight fraction Ws. Substitution of the measured intensity of the jth peak (or group of peaks) of the standard phase ...

Absorption-diffraction method
Madsen, I., Scarlett, N., Kleeberg, R. and Knorr, K.  International Tables for Crystallography (2019). Vol. H, Section 3.9.3.1, pp. 345-346 [ doi:10.1107/97809553602060000954 ]
Absorption-diffraction method 3.9.3.1. Absorption-diffraction method The various terms in equation (3.9.1) are related to the (i) instrument configuration (first set of square brackets), (ii) crystal-structure-related parameters for reflection hkl of phase [alpha] (second set of square brackets), and (iii) phase-specific and whole-sample parameters including the ...

Rietveld-based QPA
Madsen, I., Scarlett, N., Kleeberg, R. and Knorr, K.  International Tables for Crystallography (2019). Vol. H, Section 3.9.3.6, pp. 348-350 [ doi:10.1107/97809553602060000954 ]
... Hill, 1991 ; Hill & Howard, 1987 ; O'Connor & Raven, 1988 ) where K is an `experiment constant' used to put W[alpha] on ... Connor & Raven (1988 ) and Bish & Howard (1988 ) have shown that K is dependent only on the instrumental conditions and is independent ... related parameters. Therefore a single measurement is sufficient to determine K for a given instrument configuration and set of data- ...

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