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 Results for DC.creator="L." AND DC.creator="Lutterotti" in section 5.3.5 of volume H   page 1 of 2 pages.
Combined analysis: structure, texture, microstructure, stress, phase, layering and reflectivity analyses in a single approach
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5, pp. 571-578 [ doi:10.1107/97809553602060000968 ]
... carried out with X-rays on a thin film (Ferrari & Lutterotti, 1994 ) on a laboratory texture instrument using a scintillator detector. ... The first experiment of this kind using neutron TOF data (Lutterotti et al., 1997 ) was performed on the General Purpose Powder ... has been used for various purposes (Chateigner et al., 1998 ; Lutterotti et al., 2002 , 2004 ; Morales et al., 2002 , 2005 ; ...

Implementation
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.5, p. 577 [ doi:10.1107/97809553602060000968 ]
... of these requirement are actually met in the MAUD software (Lutterotti, 2010 ). References Fawcett, T. G., Kabekkodu, S. N., Blanton ... Downs, R. T., Yokochi, A. F. T., Quirós, M., Lutterotti, L., Manakova, E., Butkus, J., Moeck, P. & Le Bail, A. ( ...

Absorption and layers
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.8, pp. 576-577 [ doi:10.1107/97809553602060000968 ]
... to correctly approach the problem in a Bragg-Brentano geometry (Lutterotti et al., 1993 ) is aimed at phase analysis in the ... refined is no longer representative of the sample). References Lutterotti, L., Scardi, P. & Tomasi, A. (1993). Application of the ...

Residual strains/stresses and evaluation of macroscopic tensors
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.7, pp. 575-576 [ doi:10.1107/97809553602060000968 ]
... der Kristallphysik. Leipzig: Teubner Verlag.GoogleScholar Wang, Y. D., Peng, R. L., Zeng, X. H. & McGreevy, R. (2000). Stress-orientation distribution ... Forum, 347-349, 66-73.GoogleScholar Wang, Y. D., Wang, X.-L., Stoica, A. D., Richardson, J. W. & Peng, R. L. (2003). Determination of the stress orientation distribution function ...

Texture computation
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.6, p. 575 [ doi:10.1107/97809553602060000968 ]
... most of the texture information). References Matthies, S., Lutteroti, L. & Wenk, H.-R. (1997). Advances in texture analysis from ...

Line profiles and sample broadening
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.5, p. 575 [ doi:10.1107/97809553602060000968 ]
... to perform refinement directly using the microstructural characteristics as parameters (Lutterotti & Scardi, 1990 ; Lutterotti & Gialanella, 1998 ; Lutterotti, 2010 ). If the instrumental broadening is known (see ...

Reflection intensities
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.4, pp. 574-575 [ doi:10.1107/97809553602060000968 ]
... and structure factors are extracted simultaneously from the same data (Lutterotti & Bortolotti, 2005 ; Grässlin et al., 2015 ). References Grässlin, J., McCusker, L. B., Baerlocher, C., Gozzo, F., Schmitt, B. & Lutterotti, L. (2015). Advances in exploiting preferred orientation in ...

Background fitting
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.3, pp. 573-574 [ doi:10.1107/97809553602060000968 ]
... the experimental data minus the computed profile) as in MAUD (Lutterotti, 2010 ). In this manner, the interpolation will not take ... GSAS). Los Alamos National Laboratory Report LAUR 86-748.GoogleScholar Lutterotti, L. (2010). Total pattern fitting for the combined size- ...

Peak-displacement errors
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.2, p. 573 [ doi:10.1107/97809553602060000968 ]
Peak-displacement errors 5.3.5.4.2. Peak-displacement errors Peak shifts arise from the misalignment of one or several of the rotation axes or sample displacement from the rotation centre. For instance, in Fig. 5.3.20 we clearly observe a 2[theta] peak shift for large [chi] values and this shift would not be ...

Instrumental broadening calibration
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.1, pp. 572-573 [ doi:10.1107/97809553602060000968 ]
... spectrometer for neutron diffraction. Nucl. Instrum. 3, 223-228.GoogleScholar Schulz, L. G. (1949a). A direct method of determining preferred orientation ...

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