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 Results for DC.creator="M." AND DC.creator="Birkholz" in section 5.4.4 of volume H
Texture gradients
Birkholz, M.  International Tables for Crystallography (2019). Vol. H, Section 5.4.4.3, pp. 592-593 [ doi:10.1107/97809553602060000969 ]
... conditions but of various thicknesses and measuring each sample separately (Birkholz et al., 2000 , 2001 , 2003 ; Fenske et al., 2005 ). ... directly related to the resistivity of the ZnO:Al layers (Birkholz et al., 2003 ). Fig. 5.4.15 shows the resistivity [rho ... thin ZnO:Al films versus reciprocal texture index 1/J (Birkholz et al., 2003 ). Preferred orientation has also been ...

Pole-figure scans and analysis
Birkholz, M.  International Tables for Crystallography (2019). Vol. H, Section 5.4.4.2, pp. 590-592 [ doi:10.1107/97809553602060000969 ]
... grower, since it gives a quantitative measure for texture optimization (Birkholz et al., 2003 ). In contrast to `thick-sample' diffractometry ... of various thickness and Cu K[alpha] radiation ([mu] = 0.10631m-1). Layer thicknesses t of 0.5, 1 and 2m were chosen for the simulation and a reflection at ...

Texture factors
Birkholz, M.  International Tables for Crystallography (2019). Vol. H, Section 5.4.4.1, p. 590 [ doi:10.1107/97809553602060000969 ]
Texture factors 5.4.4.1. Texture factors Texture factors TH represent a straightforward approach to quantifying the degree of preferred orientation in a fibre-textured sample with fibre axis H. The starting point of the calculation is the integrated intensity of the measured reflection in a [theta]/2[theta] pattern, where A[theta ...

Thin-film textures and their depth dependence
Birkholz, M.  International Tables for Crystallography (2019). Vol. H, Section 5.4.4, pp. 590-593 [ doi:10.1107/97809553602060000969 ]
... the variation of texture strength with layer depth (Bonarski, 2006 ; Birkholz, 2007 ). 5.4.4.1. Texture factors | | Texture factors TH represent a ... grower, since it gives a quantitative measure for texture optimization (Birkholz et al., 2003 ). In contrast to `thick-sample' diffractometry ... of various thickness and Cu K[alpha] radiation ([mu] = 0.10631m-1). Layer thicknesses t of 0.5, 1 and ...

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