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 Results for DC.creator="M." AND DC.creator="Morales" in section 5.3.5 of volume H   page 1 of 2 pages.
Combined analysis: structure, texture, microstructure, stress, phase, layering and reflectivity analyses in a single approach
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5, pp. 571-578 [ doi:10.1107/97809553602060000968 ]
... purposes (Chateigner et al., 1998 ; Lutterotti et al., 2002 , 2004 ; Morales et al., 2002 , 2005 ; Ricote et al., 2004 ; Guilmeau et ... consistency. Considering an ensemble of N grains, with each grain m having a volume fraction [nu]m and with Sm being the single-crystal compliance tensor ...

Implementation
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.5, p. 577 [ doi:10.1107/97809553602060000968 ]
... D., Downs, R. T., Yokochi, A. F. T., Quirós, M., Lutterotti, L., Manakova, E., Butkus, J., Moeck, P. & Le Bail ...

Absorption and layers
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.8, pp. 576-577 [ doi:10.1107/97809553602060000968 ]
... thin films. J. Appl. Cryst. 39, 487-501.GoogleScholar Volz, H. M., Vogel, S. C., Necker, C. T., Roberts, J. A., Lawson ...

Residual strains/stresses and evaluation of macroscopic tensors
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.7, pp. 575-576 [ doi:10.1107/97809553602060000968 ]
... consistency. Considering an ensemble of N grains, with each grain m having a volume fraction [nu]m and with Sm being the single-crystal compliance tensor of ... Humbert, 1993 ) the inversion property is guaranteed, Replacing the subscript m with the rotation g to bring the crystal tensor ...

Texture computation
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.6, p. 575 [ doi:10.1107/97809553602060000968 ]
Texture computation 5.3.5.4.6. Texture computation The texture factors in (5.3.63 ) can be computed using one of the methods reported in Section 5.3.4 for Rietveld analysis, but only those associated with an OD computation, i.e. all but the empirical methods such as the March-Dollase and Donnet-Jouanneaux methods. To ensure a ...

Line profiles and sample broadening
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.5, p. 575 [ doi:10.1107/97809553602060000968 ]
... Adv. X-ray Anal. 35A, 577-584.GoogleScholar Lutterotti, L., Voltolini, M., Wenk, H.-R., Bandyopadhyay, K. & Vanorio, T. (2010). Texture ...

Reflection intensities
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.4, pp. 574-575 [ doi:10.1107/97809553602060000968 ]
... materials. J. Appl. Cryst. 46, 173-180.GoogleScholar Lutterotti, L. & Bortolotti, M. (2005). Algorithms for solving crystal structure using texture. Acta ...

Background fitting
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.3, pp. 573-574 [ doi:10.1107/97809553602060000968 ]
Background fitting 5.3.5.4.3. Background fitting Furthermore, depending on many factors such as sample shape and absorption, the background B can also vary with the various angles of rotation. These variations have to be modelled, which is usually accomplished through a polynomial fit on all rotation axes, or more complex functions such ...

Peak-displacement errors
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.2, p. 573 [ doi:10.1107/97809553602060000968 ]
Peak-displacement errors 5.3.5.4.2. Peak-displacement errors Peak shifts arise from the misalignment of one or several of the rotation axes or sample displacement from the rotation centre. For instance, in Fig. 5.3.20 we clearly observe a 2[theta] peak shift for large [chi] values and this shift would not be ...

Instrumental broadening calibration
Chateigner, D., Lutterotti, L. and Morales, M.  International Tables for Crystallography (2019). Vol. H, Section 5.3.5.4.1, pp. 572-573 [ doi:10.1107/97809553602060000968 ]
Instrumental broadening calibration 5.3.5.4.1. Instrumental broadening calibration The spectrometer space is multidimensional, with each rotation axis possibly giving rise to defocusing or misalignment effects. Each of these aberrations has to be measured and corrected for. For instance, in dealing with goniometer misalignments (which should be minimized as much as possible by ...

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