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 Results for DC.creator="S." AND DC.creator="van" AND DC.creator="Smaalen" in section 4.8.6 of volume H
Observed structure factors
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E.  International Tables for Crystallography (2019). Vol. H, Section 4.8.6.4, p. 480 [ doi:10.1107/97809553602060000963 ]
... one unit cell. References Bagautdinov, B., Luedecke, J., Schneider, M. & van Smaalen, S. (1998). Disorder in the crystal structure of Cs2HgCl4 ...

Prior-derived F constraints
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E.  International Tables for Crystallography (2019). Vol. H, Section 4.8.6.3, p. 480 [ doi:10.1107/97809553602060000963 ]
... on calculated structure factors, , of the prior structure model (Palatinus & van Smaalen, 2005 ): where the symbols have the same meaning as in ... maximum entropy method. Phys. Rev. B, 83, 064107.GoogleScholar Palatinus, L. & van Smaalen, S. (2005). The prior-derived F constraints ...

Constraints using `partly phased' reflections for anomalous-scattering X-ray powder diffraction
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E.  International Tables for Crystallography (2019). Vol. H, Section 4.8.6.2, pp. 479-480 [ doi:10.1107/97809553602060000963 ]
Constraints using `partly phased' reflections for anomalous-scattering X-ray powder diffraction 4.8.6.2. Constraints using `partly phased' reflections for anomalous-scattering X-ray powder diffraction X-ray anomalous scattering from powders can be used for ab initio structure determination if at least two different data sets are available: one measured with ...

F and G constraints
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E.  International Tables for Crystallography (2019). Vol. H, Section 4.8.6.1, pp. 478-479 [ doi:10.1107/97809553602060000963 ]
... derivative of the F constraint. References Dinnebier, R. E., Vensky, S., Jansen, M. & Hanson, J. C. (2005). Crystal structures and ... Appl. Cryst. 2, 65-71.GoogleScholar Sakata, M., Mori, R., Kumazawza, S., Takata, M. & Toraya, H. (1990). Electron-density distribution from ... Appl. Cryst. 23, 526-534.GoogleScholar Samy, A., Dinnebier, R. E., van Smaalen, S. & Jansen, M. (2010). Maximum entropy method ...

Constraints in the MEM based on the measured intensities from powder-diffraction data
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E.  International Tables for Crystallography (2019). Vol. H, Section 4.8.6, pp. 477-480 [ doi:10.1107/97809553602060000963 ]
... on calculated structure factors, , of the prior structure model (Palatinus & van Smaalen, 2005 ): where the symbols have the same meaning as in ... one unit cell. References Bagautdinov, B., Luedecke, J., Schneider, M. & van Smaalen, S. (1998). Disorder in the crystal structure ...

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