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 Results for DC.creator="T." AND DC.creator="S." AND DC.creator="Baker" in section 19.6.3 of volume F
Required properties of the illuminating electron beam
Baker, T. S. and Henderson, R.  International Tables for Crystallography (2012). Vol. F, Section 19.6.3.3, p. 595 [ doi:10.1107/97809553602060000872 ]
Required properties of the illuminating electron beam 19.6.3.3. Required properties of the illuminating electron beam The important properties of the image in terms of defocus, astigmatism, and the presence and effect of amplitude or phase contrast are discussed in Section 19.6.5. Microscopes with field emission guns (FEGs) produce the best-quality ...

Radiation damage
Baker, T. S. and Henderson, R.  International Tables for Crystallography (2012). Vol. F, Section 19.6.3.2, pp. 594-595 [ doi:10.1107/97809553602060000872 ]
... radiation damage. Acta Cryst. D56, 328-341. Cheng, Y. & Walz, T. (2009). The advent of near-atomic resolution in single ... limitations'. J. Struct. Biol. 163, 271-276. Maki-Yonekura, S. & Yonekura, K. (2008). Electron digital imaging toward high-resolution ... biological macromolecules. Microsc. Microanal. 14, 362-369. Meents, A., Gutmann, S., Wagner, A. & Schulze-Briese, C. (2010). Origin and ...

Elastic and inelastic scattering
Baker, T. S. and Henderson, R.  International Tables for Crystallography (2012). Vol. F, Section 19.6.3.1, p. 594 [ doi:10.1107/97809553602060000872 ]
... References Kabius, B., Hartel, P., Haider, M., Muller, H., Uhlemann, S., Loebau, U., Zach, J. & Rose, H. (2009). First application ...

Physics of electron scattering and radiation damage
Baker, T. S. and Henderson, R.  International Tables for Crystallography (2012). Vol. F, Section 19.6.3, pp. 593-595 [ doi:10.1107/97809553602060000872 ]
... radiation damage. Acta Cryst. D56, 328-341. Cheng, Y. & Walz, T. (2009). The advent of near-atomic resolution in single ... 276. Kabius, B., Hartel, P., Haider, M., Muller, H., Uhlemann, S., Loebau, U., Zach, J. & Rose, H. (2009). First application ... filtered TEM. J. Electron Microsc. 58, 147-155. Maki-Yonekura, S. & Yonekura, K. (2008). Electron digital imaging toward high- ...

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