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Intensity estimation
Kabsch, W.  International Tables for Crystallography (2012). Vol. F, Section 11.3.3.4, pp. 276-277 [ doi:10.1107/97809553602060000832 ]
... profile fitting has a long tradition (Diamond, 1969; Ford, 1974; Kabsch, 1988b; Otwinowski, 1993). Implementations of the method differ mainly ... applied to precession photographs. J. Appl. Cryst. 7, 555-564. Kabsch, W. (1988b). Evaluation of single-crystal X-ray diffraction ...
     [more results from section 11.3.3 in volume F]

Refinement
Kabsch, W.  International Tables for Crystallography (2012). Vol. F, Section 11.3.2.8, p. 275 [ doi:10.1107/97809553602060000832 ]
Refinement 11.3.2.8. Refinement For a fixed detector, the diffraction pattern depends on the parameters S0, m2, b1, b2, b3, X0, Y0, F. Starting values for the parameters can be obtained by the procedures described above, which do not rely on prior knowledge of the crystal orientation, space-group symmetry or unit ...
     [more results from section 11.3.2 in volume F]

Introduction
Kabsch, W.  International Tables for Crystallography (2012). Vol. F, Section 11.3.1, p. 272 [ doi:10.1107/97809553602060000832 ]
... have been discussed by Pflugrath (1997). References Pflugrath, J. W. (1997). Diffraction-data processing for electronic detectors: theory and ...

Availability
Kabsch, W.  International Tables for Crystallography (2012). Vol. F, Section 11.6.6, p. 310 [ doi:10.1107/97809553602060000835 ]
Availability 11.6.6. Availability Documentation and executable versions of the XDS package for widely used computer systems running under Linux or OSX can be obtained from the XDS homepage (http://xds.mpimf-heidelberg.mpg.de/ ) free of charge for use by academics for noncommercial applications. Additional information can be found at http://strucbio.biologie.uni-konstanz.de/xdswiki ...

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