International Tables for Crystallography (2006). Vol. B. ch. 4.2, pp. 407-442   | 1 | 2 |
https://doi.org/10.1107/97809553602060000564

Chapter 4.2. Disorder diffuse scattering of X-rays and neutrons

Contents

  • 4.2. Disorder diffuse scattering of X-rays and neutrons  (pp. 407-442) | html | pdf | chapter contents |
    H. Jagodzinski and F. Frey
    • 4.2.1. Scope of this chapter  (pp. 407-408) | html | pdf |
    • 4.2.2. Summary of basic scattering theory  (pp. 408-410) | html | pdf |
    • 4.2.3. General treatment  (pp. 410-420) | html | pdf |
      • 4.2.3.1. Qualitative interpretation of diffuse scattering  (pp. 410-418) | html | pdf |
        • 4.2.3.1.1. Fourier transforms  (pp. 410-411) | html | pdf |
        • 4.2.3.1.2. Applications  (pp. 411-418) | html | pdf |
      • 4.2.3.2. Guideline to solve a disorder problem  (pp. 418-420) | html | pdf |
    • 4.2.4. Quantitative interpretation  (pp. 420-438) | html | pdf |
      • 4.2.4.1. Introduction  (pp. 420-421) | html | pdf |
      • 4.2.4.2. One-dimensional disorder of ordered layers  (pp. 421-425) | html | pdf |
        • 4.2.4.2.1. Stacking disorder in close-packed structures  (pp. 423-425) | html | pdf |
      • 4.2.4.3. Two-dimensional disorder of chains  (pp. 425-429) | html | pdf |
        • 4.2.4.3.1. Scattering by randomly distributed collinear chains  (pp. 425-427) | html | pdf |
        • 4.2.4.3.2. Disorder within randomly distributed collinear chains  (pp. 427-429) | html | pdf |
          • 4.2.4.3.2.1. General treatment  (p. 427) | html | pdf |
          • 4.2.4.3.2.2. Orientational disorder  (p. 427) | html | pdf |
          • 4.2.4.3.2.3. Longitudinal disorder  (pp. 428-429) | html | pdf |
        • 4.2.4.3.3. Correlations between different almost collinear chains  (p. 429) | html | pdf |
      • 4.2.4.4. Disorder with three-dimensional correlations (defects, local ordering and clustering)  (pp. 429-436) | html | pdf |
        • 4.2.4.4.1. General formulation (elastic diffuse scattering)  (pp. 429-431) | html | pdf |
        • 4.2.4.4.2. Random distribution  (pp. 431-432) | html | pdf |
        • 4.2.4.4.3. Short-range order in multi-component systems  (p. 432) | html | pdf |
        • 4.2.4.4.4. Displacements: general remarks  (pp. 432-433) | html | pdf |
        • 4.2.4.4.5. Distortions in binary systems  (pp. 433-435) | html | pdf |
        • 4.2.4.4.6. Powder diffraction  (p. 435) | html | pdf |
        • 4.2.4.4.7. Small concentrations of defects  (p. 435) | html | pdf |
        • 4.2.4.4.8. Cluster method  (p. 435) | html | pdf |
        • 4.2.4.4.9. Comparison between X-ray and neutron methods  (pp. 435-436) | html | pdf |
        • 4.2.4.4.10. Dynamic properties of defects  (p. 436) | html | pdf |
      • 4.2.4.5. Orientational disorder  (pp. 436-438) | html | pdf |
        • 4.2.4.5.1. General expressions  (pp. 436-437) | html | pdf |
        • 4.2.4.5.2. Rotational structure (form) factor  (pp. 437-438) | html | pdf |
        • 4.2.4.5.3. Short-range correlations  (p. 438) | html | pdf |
    • 4.2.5. Measurement of diffuse scattering  (pp. 438-442) | html | pdf |
    • References | html | pdf |
    • Figures
      • Fig. 4.2.3.1. Model of the two-dimensional distribution of point defects, causing changes in the surroundings  (p. 412) | html | pdf |
      • Fig. 4.2.3.2. One-dimensional Patterson functions of various point-defect distributions  (p. 412) | html | pdf |
      • Fig. 4.2.3.3. Periodic array of domains consisting of two different atoms, represented by different heights  (p. 413) | html | pdf |
      • Fig. 4.2.3.4. Influence of distortions at the boundary of domains, and separation into two parts  (p. 415) | html | pdf |
      • Fig. 4.2.3.5. Typical distributions of mixed crystals (unmixing)  (p. 416) | html | pdf |
      • Fig. 4.2.3.6. Decomposition of Fig. 4.2.3.5(a) into a periodic and a rapidly convergent part  (p. 416) | html | pdf |
      • Fig. 4.2.3.7. The same distribution (cf. Fig. 4.2.3.5) in the case of superstructure formation  (p. 417) | html | pdf |
      • Fig. 4.2.4.1. Construction of the correlation function in the method of overlapping clusters  (p. 433) | html | pdf |
      • Fig. 4.2.5.1. Schematic sketch of a diffractometer setting  (p. 440) | html | pdf |
      • Fig. 4.2.5.2. Line profiles in powder diffraction for sharp and diffuse reflections  (p. 442) | html | pdf |