Single-crystal X-ray techniques

Helliwell, J. R.

doi:10.1107/97809553602060000577

Angular distribution of reflections in Laue diffraction 2.2.1.4

Angular setting errors (precession) 2.2.5.1

Anti-equi-inclination setting 2.2.3.2

Area-detector diffractometry 2.2.6, 2.2.6.1

Area detectors

geometric effects 2.2.7.4

non-uniformity of response 2.2.7.4

Blind region 2.2.3.5

Bremsstrahlung 2.2.7.2, 2.2.7.2

Collimation 2.2.7.1

Cone-axis photography 2.2.5.4, 2.2.5.5

Conventional X-ray sources 2.2.7.2

Crystal(s)

datum orientation 2.2.3.3, 2.2.3.3

orientation matrix 2.2.3.3

rocking curves 2.2.7.2, 2.2.7.2

rocking widths 2.2.3.4, 2.2.3.5

Crystal-orientation matrix 2.2.3.3

Cylindrical detector recording 2.2.3.2, 2.2.3.2

Datum orientation of the crystal 2.2.3.3, 2.2.3.3

Detector recording

cylindrical 2.2.3.2, 2.2.3.2

plane 2.2.3.2, 2.2.3.2

V-shaped 2.2.3.2, 2.2.3.2

Diffraction

coordinates 2.2.3.2

geometry, practical realization 2.2.7

spot size and shape 2.2.7.1, 2.2.7.2, 2.2.7.3

Diffractometers

area-detector 2.2.6, 2.2.6.1

kappa 2.2.6.1, 2.2.6.2

Diffractometry 2.2.6

Double-crystal monochromator (at synchrotron) 2.2.7.3

Equi-inclination setting 2.2.3.2

Ewald sphere 2.2.1.1

Filters 2.2.7.2, 2.2.7.2

Flat-cone setting 2.2.3.2

Flat-crystal monochromator 2.2.7.2

Geometrical aberrations 2.2.7.4

Gnomonic transformations 2.2.1.4, 2.2.1.5, 2.2.1.5

Graphite

monochromator 2.2.7.2, 2.2.7.2

Kappa diffractometer (definition) 2.2.6.2

Lambda curves (Laue) 2.2.7.3

Laue diffraction

multiplicity distribution 2.2.1.3

Laue geometry 2.2, 2.2, 2.2, 2.2, 2.2.1, 2.2.7.3

Laue patterns 2.2.1.1, 2.2.1.1

Layer-line screen (precession) 2.2.4.1

Layer-line screen (Weissenberg) 2.2.5.1

Maximum oscillation angle 2.2.3.4

Mirrors 2.2.7.1

Misorientation matrices 2.2.3.3

Monochromatic still exposure 2.2.2.1

Monochromators 2.2.7.1

graphite 2.2.7.2

perfect-crystal 2.2.7.3

Multiple-order reflections (Laue) 2.2.1.3

Neutron diffraction 2.2.1

Nodal reflections 2.2.1.2

Non-uniformity of response, area detectors 2.2.7.4

Normal-beam equatorial geometry 2.2.6.2

Normal-beam rotation method 2.2.3.2, 2.2.3.2

Numbers of reciprocal-lattice points within resolution sphere 2.2.1.3

Obliquity 2.2.7.4

Oscillation angle, maximum 2.2.3.4

Parallax 2.2.7.4

Partially stimulated reflections (partials) 2.2.4.1

Photographs

cone-axis 2.2.5.5

setting (precession) 2.2.5.1

upper-layer (precession) 2.2.5.4

upper-layer (Weissenberg) 2.2.4.3

zero-layer (precession) 2.2.5.3

zero-layer (Weissenberg) 2.2.4.2

Plane detector recording 2.2.3.2, 2.2.3.2

Point-spread factor 2.2.7.4

Precession geometry 2.2.5

Reflections

multiple-order (Laue) 2.2.1.3

nodal 2.2.1.4

single-order (Laue) 2.2.1.3

Resolution

sphere 2.2.1.1, 2.2.1.1

Rocking curves 2.2.7.2, 2.2.7.2, 2.2.7.3

Rotation/oscillation geometry 2.2.3

Rotation method 2.2.2

normal beam 2.2.3.2, 2.2.3.2

Setting

anti-equi-inclination 2.2.3.2

equi-inclination 2.2.3.2

flat cone 2.2.3.2

Guinier 2.2.7.2

photograph (precession) 2.2.5.1

Single crystal

monochromator (at synchrotron) 2.2.7.3, 2.2.7.2

X-ray techniques 2.2

Single-order reflections (Laue) 2.2.1.3

Spatial distortions 2.2.7.4

Spot size and shape 2.2.7.1, 2.2.7.2, 2.2.7.3

Stereographic transformation 2.2.1.5, 2.2.1.5

Still exposure, monochromatic 2.2.2.1

Synchrotron radiation

sources 2.2.7.3

Transformation(s)

gnomonic 2.2.1.4, 2.2.1.5, 2.2.1.5

stereographic 2.2.1.5, 2.2.1.5

Upper-layer photographs (precession) 2.2.5.4

Upper-layer photographs (Weissenberg) 2.2.4.3

V-shaped detector recording 2.2.3.2, 2.2.3.2

Wavelength normalization (Laue) 2.2.7.3

Weissenberg geometry 2.2.4

X-ray background over a spot 2.2.4.1

X-ray optics 2.2.7

X-ray source(s)

conventional 2.2.7, 2.2.7.2

synchrotron 2.2.7.3

X-ray techniques, single-crystal 2.2

Zero-layer photographs (precession) 2.2.5.3

Zero-layer photographs (Weissenberg) 2.2.4.2

Chapter 2.2. Single-crystal X-ray techniques

Chapter index