Figure 2.3.1.7

Parrish, W.; Langford, J. I.

doi:10.1107/97809553602060000578

International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

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International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 47

Figure 2.3.1.7

W. Parrish^a ^‡ and J. I. Langford^b

^a IBM Almaden Research Center, San Jose, CA, USA, and ^bSchool of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

Figure 2.3.1.7

(a) θ–2θ setting at 0°. Flat plate or long narrow slit is rotated to position of highest intensity. (b) and (c) Profiles obtained with correct θ–2θ setting (solid profile) and 1 and 2° mis-settings (dashed profiles) at (b) 21° and (c) 60° (2θ).