International Tables for Crystallography
Volume C: Mathematical, physical and chemical tables

First online edition (2006)   ISBN: 978-1-4020-1900-5   eISBN: 978-1-4020-5408-2   doi: 10.1107/97809553602060000103

Edited by E. Prince

Contents

• Preface to the third edition  (p. xxxi) | html | pdf |
  E. Prince

• Part 1. Crystal geometry and symmetry
  • 1.1. Summary of general formulae  (pp. 2-5) | html | pdf | chapter contents |
    E. Koch
    • 1.1.1. General relations between direct and reciprocal lattices  (pp. 2-3) | html | pdf |
    • 1.1.2. Lattice vectors, point rows, and net planes  (pp. 3-4) | html | pdf |
    • 1.1.3. Angles in direct and reciprocal space  (pp. 4-5) | html | pdf |
    • 1.1.4. The Miller formulae  (p. 5) | html | pdf |
    • References | html | pdf |
  • 1.2. Application to the crystal systems  (pp. 6-9) | html | pdf | chapter contents |
    E. Koch
    • 1.2.1. Triclinic crystal system  (p. 6) | html | pdf |
    • 1.2.2. Monoclinic crystal system  (p. 6) | html | pdf |
    • 1.2.3. Orthorhombic crystal system  (pp. 6-7) | html | pdf |
    • 1.2.4. Tetragonal crystal system  (p. 7) | html | pdf |
    • 1.2.5. Trigonal and hexagonal crystal system  (pp. 7-9) | html | pdf |
    • 1.2.6. Cubic crystal system  (p. 9) | html | pdf |
    • References | html | pdf |
  • 1.3. Twinning  (pp. 10-14) | html | pdf | chapter contents |
    E. Koch
    • 1.3.1. General remarks  (p. 10) | html | pdf |
    • 1.3.2. Twin lattices  (pp. 10-12) | html | pdf |
    • 1.3.3. Implication of twinning in reciprocal space  (p. 12) | html | pdf |
    • 1.3.4. Twinning by merohedry  (pp. 12-14) | html | pdf |
    • 1.3.5. Calculation of the twin element  (p. 14) | html | pdf |
    • References | html | pdf |
  • 1.4. Arithmetic crystal classes and symmorphic space groups  (pp. 15-22) | html | pdf | chapter contents |
    A. J. C. Wilson
    • 1.4.1. Arithmetic crystal classes  (pp. 15-19) | html | pdf |
    • 1.4.2. Classification of space groups  (pp. 20-21) | html | pdf |
    • 1.4.3. Effect of dispersion on diffraction symmetry  (p. 21) | html | pdf |
    • References | html | pdf |

• Part 2. Diffraction geometry and its practical realization
  • 2.1. Classification of experimental techniques  (pp. 24-25) | html | pdf | chapter contents |
    J. R. Helliwell
    • References | html | pdf |
  • 2.2. Single-crystal X-ray techniques  (pp. 26-41) | html | pdf | chapter contents |
    J. R. Helliwell
    • 2.2.1. Laue geometry  (pp. 26-29) | html | pdf |
    • 2.2.2. Monochromatic methods  (pp. 29-30) | html | pdf |
    • 2.2.3. Rotation/oscillation geometry  (pp. 31-34) | html | pdf |
    • 2.2.4. Weissenberg geometry  (pp. 34-35) | html | pdf |
    • 2.2.5. Precession geometry  (pp. 35-36) | html | pdf |
    • 2.2.6. Diffractometry  (pp. 36-37) | html | pdf |
    • 2.2.7. Practical realization of diffraction geometry: sources, optics, and detectors  (pp. 37-41) | html | pdf |
    • References | html | pdf |
  • 2.3. Powder and related techniques: X-ray techniques  (pp. 42-79) | html | pdf | chapter contents |
    W. Parrish and J. I. Langford
    • 2.3.1. Focusing diffractometer geometries  (pp. 43-54) | html | pdf |
    • 2.3.2. Parallel-beam geometries, synchrotron radiation  (pp. 54-60) | html | pdf |
    • 2.3.3. Specimen factors, angle, intensity, and profile-shape measurement  (pp. 60-69) | html | pdf |
    • 2.3.4. Powder cameras  (pp. 70-71) | html | pdf |
    • 2.3.5. Generation, modifications, and measurement of X-ray spectra  (pp. 71-79) | html | pdf |
    • References | html | pdf |
  • 2.4. Powder and related techniques: electron and neutron techniques  (pp. 80-83) | html | pdf | chapter contents |
    J. M. Cowley and A. W. Hewat
    • 2.4.1. Electron techniques  (pp. 80-82) | html | pdf |
      J. M. Cowley
    • 2.4.2. Neutron techniques  (pp. 82-83) | html | pdf |
      A. W. Hewat
    • References | html | pdf |
  • 2.5. Energy-dispersive techniques  (pp. 84-88) | html | pdf | chapter contents |
    B. Buras, W. I. F. David, L. Gerward, J. D. Jorgensen and B. T. M. Willis
    • 2.5.1. Techniques for X-rays  (pp. 84-87) | html | pdf |
      B. Buras and L. Gerward
    • 2.5.2. White-beam and time-of-flight neutron diffraction  (pp. 87-88) | html | pdf |
      J. D. Jorgensen, W. I. F. David and B. T. M. Willis
    • References | html | pdf |
  • 2.6. Small-angle techniques  (pp. 89-112) | html | pdf | chapter contents |
    O. Glatter and R. May
    • 2.6.1. X-ray techniques  (pp. 89-104) | html | pdf |
      O. Glatter
    • 2.6.2. Neutron techniques  (pp. 105-112) | html | pdf |
      R. May
    • References | html | pdf |
  • 2.7. Topography  (pp. 113-123) | html | pdf | chapter contents |
    A. R. Lang
    • 2.7.1. Principles  (pp. 113-114) | html | pdf |
    • 2.7.2. Single-crystal techniques  (pp. 114-117) | html | pdf |
    • 2.7.3. Double-crystal topography  (pp. 117-119) | html | pdf |
    • 2.7.4. Developments with synchrotron radiation  (pp. 119-121) | html | pdf |
    • 2.7.5. Some special techniques  (pp. 121-123) | html | pdf |
    • References | html | pdf |
  • 2.8. Neutron diffraction topography  (pp. 124-125) | html | pdf | chapter contents |
    M. Schlenker and J. Baruchel
    • 2.8.1. Introduction  (p. 124) | html | pdf |
    • 2.8.2. Implementation  (p. 124) | html | pdf |
    • 2.8.3. Application to investigations of heavy crystals  (p. 124) | html | pdf |
    • 2.8.4. Investigation of magnetic domains and magnetic phase transitions  (pp. 124-125) | html | pdf |
    • References | html | pdf |
  • 2.9. Neutron reflectometry  (pp. 126-146) | html | pdf | chapter contents |
    G. S. Smith and C. F. Majkrzak
    • 2.9.1. Introduction  (p. 126) | html | pdf |
    • 2.9.2. Theory of elastic specular neutron reflection  (pp. 126-127) | html | pdf |
    • 2.9.3. Polarized neutron reflectivity  (p. 127) | html | pdf |
    • 2.9.4. Surface roughness  (p. 128) | html | pdf |
    • 2.9.5. Experimental methodology  (pp. 128-129) | html | pdf |
    • 2.9.6. Resolution in real space  (p. 129) | html | pdf |
    • 2.9.7. Applications of neutron reflectometry  (pp. 129-130) | html | pdf |
    • References | html | pdf |

• Part 3. Preparation and examination of specimens
  • 3.1. Preparation, selection, and investigation of specimens  (pp. 148-155) | html | pdf | chapter contents |
    P. F. Lindley
    • 3.1.1. Crystallization  (pp. 148-151) | html | pdf |
    • 3.1.2. Selection of single crystals  (pp. 151-155) | html | pdf |
    • References | html | pdf |
  • 3.2. Determination of the density of solids  (pp. 156-159) | html | pdf | chapter contents |
    F. M. Richards and P. F. Lindley
    • 3.2.1. Introduction  (p. 156) | html | pdf |
      P. F. Lindley
    • 3.2.2. Description and discussion of techniques  (pp. 156-159) | html | pdf |
      F. M. Richards
    • 3.2.3. Biological macromolecules  (p. 159) | html | pdf |
      P. F. Lindley
    • References | html | pdf |
  • 3.3. Measurement of refractive index  (pp. 160-161) | html | pdf | chapter contents |
    E. S. Larsen Jr, R. Meyrowitz and A. J. C. Wilson
    • 3.3.1. Introduction  (p. 160) | html | pdf |
    • 3.3.2. Media for general use  (p. 160) | html | pdf |
    • 3.3.3. High-index media  (pp. 160-161) | html | pdf |
    • 3.3.4. Media for organic substances  (p. 161) | html | pdf |
    • References | html | pdf |
  • 3.4. Mounting and setting of specimens for X-ray crystallographic studies  (pp. 162-170) | html | pdf | chapter contents |
    P. F. Lindley
    • 3.4.1. Mounting of specimens  (pp. 162-167) | html | pdf |
    • 3.4.2. Setting of single crystals by X-rays  (pp. 167-170) | html | pdf |
    • References | html | pdf |
  • 3.5. Preparation of specimens for electron diffraction and electron microscopy  (pp. 171-176) | html | pdf | chapter contents |
    N. J. Tighe, J. R. Fryer and H. M. Flower
    • 3.5.1. Ceramics and rock minerals  (pp. 171-173) | html | pdf |
    • 3.5.2. Metals  (pp. 173-176) | html | pdf |
    • 3.5.3. Polymers and organic specimens  (p. 176) | html | pdf |
    • References | html | pdf |
  • 3.6. Specimens for neutron diffraction  (pp. 177-184) | html | pdf | chapter contents |
    B. T. M. Willis

• Part 4. Production and properties of radiations
  • 4.1. Radiations used in crystallography  (pp. 186-190) | html | pdf | chapter contents |
    V. Valvoda
    • 4.1.1. Introduction  (p. 186) | html | pdf |
    • 4.1.2. Electromagnetic waves and particles  (pp. 186-187) | html | pdf |
    • 4.1.3. Most frequently used radiations  (pp. 187-188) | html | pdf |
    • 4.1.4. Special applications of X-rays, electrons, and neutrons  (p. 189) | html | pdf |
    • 4.1.5. Other radiations  (pp. 189-190) | html | pdf |
    • References | html | pdf |
  • 4.2. X-rays  (pp. 191-258) | html | pdf | chapter contents |
    U. W. Arndt, D. C. Creagh, R. D. Deslattes, J. H. Hubbell, P. Indelicato, E. G. Kessler Jr and E. Lindroth
    • 4.2.1. Generation of X-rays  (pp. 191-200) | html | pdf |
      U. W. Arndt
    • 4.2.2. X-ray wavelengths  (pp. 200-212) | html | pdf |
      R. D. Deslattes, E. G. Kessler Jr, P. Indelicato and E. Lindroth
    • 4.2.3. X-ray absorption spectra  (pp. 213-220) | html | pdf |
      D. C. Creagh
    • 4.2.4. X-ray absorption (or attenuation) coefficients  (pp. 220-229) | html | pdf |
      D. C. Creagh and J. H. Hubbell
    • 4.2.5. Filters and monochromators  (pp. 229-241) | html | pdf |
      D. C. Creagh
    • 4.2.6. X-ray dispersion corrections  (pp. 241-258) | html | pdf |
      D. C. Creagh
    • References | html | pdf |
  • 4.3. Electron diffraction  (pp. 259-429) | html | pdf | chapter contents |
    C. Colliex, J. M. Cowley, S. L. Dudarev, M. Fink, J. Gjønnes, R. Hilderbrandt, A. Howie, D. F. Lynch, L. M. Peng, G. Ren, A. W. Ross, V. H. Smith Jr, J. C. H. Spence, J. W. Steeds, J. Wang, M. J. Whelan and B. B. Zvyagin
    • 4.3.1. Scattering factors for the diffraction of electrons by crystalline solids  (pp. 259-262) | html | pdf |
      J. M. Cowley
    • 4.3.2. Parameterizations of electron atomic scattering factors  (p. 262) | html | pdf |
      J. M. Cowley, L. M. Peng, G. Ren, S. L. Dudarev and M. J. Whelan
    • 4.3.3. Complex scattering factors for the diffraction of electrons by gases  (pp. 262-391) | html | pdf |
      A. W. Ross, M. Fink, R. Hilderbrandt, J. Wang and V. H. Smith Jr
    • 4.3.4. Electron energy-loss spectroscopy on solids  (pp. 391-412) | html | pdf |
      C. Colliex
    • 4.3.5. Oriented texture patterns  (pp. 412-414) | html | pdf |
      B. B. Zvyagin
    • 4.3.6. Computation of dynamical wave amplitudes  (pp. 414-416) | html | pdf |
    • 4.3.7. Measurement of structure factors and determination of crystal thickness by electron diffraction  (pp. 416-419) | html | pdf |
      J. Gjønnes and J. W. Steeds
    • 4.3.8. Crystal structure determination by high-resolution electron microscopy  (pp. 419-429) | html | pdf |
      J. C. H. Spence and J. M. Cowley
    • References | html | pdf |
  • 4.4. Neutron techniques  (pp. 430-487) | html | pdf | chapter contents |
    I. S. Anderson, P. J. Brown, J. M. Carpenter, G. Lander, R. Pynn, J. M. Rowe, O. Schärpf, V. F. Sears and B. T. M. Willis
    • 4.4.1. Production of neutrons  (pp. 430-431) | html | pdf |
      J. M. Carpenter and G. Lander
    • 4.4.2. Beam-definition devices  (pp. 431-443) | html | pdf |
      I. S. Anderson and O. Schärpf
    • 4.4.3. Resolution functions  (pp. 443-444) | html | pdf |
      R. Pynn and J. M. Rowe
    • 4.4.4. Scattering lengths for neutrons  (pp. 444-454) | html | pdf |
      V. F. Sears
    • 4.4.5. Magnetic form factors  (pp. 454-461) | html | pdf |
      P. J. Brown
    • 4.4.6. Absorption coefficients for neutrons  (p. 461) | html | pdf |
      B. T. M. Willis
    • References | html | pdf |

• Part 5. Determination of lattice parameters
  • 5.1. Introduction  (p. 490) | html | pdf | chapter contents |
    A. J. C. Wilson
  • 5.2. X-ray diffraction methods: polycrystalline  (pp. 491-504) | html | pdf | chapter contents |
    W. Parrish, A. J. C. Wilson and J. I. Langford
    • 5.2.1. Introduction  (pp. 491-492) | html | pdf |
    • 5.2.2. Wavelength and related problems  (pp. 492-493) | html | pdf |
    • 5.2.3. Geometrical and physical aberrations  (pp. 493-494) | html | pdf |
    • 5.2.4. Angle-dispersive diffractometer methods: conventional sources  (p. 495) | html | pdf |
    • 5.2.5. Angle-dispersive diffractometer methods: synchrotron sources  (pp. 495-496) |