Figure 2.3.5.2

Parrish, W.; Langford, J. I.

doi:10.1107/97809553602060000578

International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

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International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 73

Figure 2.3.5.2

W. Parrish^a ^‡ and J. I. Langford^b

^a IBM Almaden Research Center, San Jose, CA, USA, and ^bSchool of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

Figure 2.3.5.2

(a) Transmission of Be, Al and air as a function of wavelength. (b) Method for measuring X-ray tube focus by scanning slit S₂ and detector D. Slit S₁ is fixed and the ratio of the distances d₂/d₁ gives the magnification. (c) Intensity of a copper target tube as a function of kV for various take-off angles. (d) Intensity and brightness as a function of take-off angle of a copper target tube operated at 50 kV. The intensity distributions for 1 and 4° entrance-slit apertures are shown at the top, and terms used to define ψ and α_ES are shown in the lower insert.