International Tables for Crystallography (2006). Vol. C, ch. 4.1, pp. 186-190
doi: 10.1107/97809553602060000591

Chapter 4.1. Radiations used in crystallography

Contents

  • 4.1. Radiations used in crystallography  (pp. 186-190) | html | pdf | chapter contents |
    • 4.1.1. Introduction  (p. 186) | html | pdf |
    • 4.1.2. Electromagnetic waves and particles  (pp. 186-187) | html | pdf |
    • 4.1.3. Most frequently used radiations  (pp. 187-188) | html | pdf |
    • 4.1.4. Special applications of X-rays, electrons, and neutrons  (p. 189) | html | pdf |
      • 4.1.4.1. X-rays, synchrotron radiation, and γ-rays  (p. 189) | html | pdf |
      • 4.1.4.2. Electrons  (p. 189) | html | pdf |
      • 4.1.4.3. Neutrons  (p. 189) | html | pdf |
    • 4.1.5. Other radiations  (pp. 189-190) | html | pdf |
      • 4.1.5.1. Atomic and molecular beams  (p. 189) | html | pdf |
      • 4.1.5.2. Positrons and muons  (p. 189) | html | pdf |
      • 4.1.5.3. Infrared, visible, and ultraviolet light  (pp. 189-190) | html | pdf |
      • 4.1.5.4. Radiofrequency and microwaves  (p. 190) | html | pdf |
    • References | html | pdf |
    • Figures
      • Fig. 4.1.1.1. Schematic diagram of the main types of radiation application in crystallography (dashed lines represent structure investigation on a larger than atomic scale)  (p. 186) | html | pdf |
      • Fig. 4.1.2.1. Comparison of the energy, frequency, and wavelength of the electromagnetic waves used in crystallography (logarithmic scale)  (p. 187) | html | pdf |
      • Fig. 4.1.3.1. Angular dependence of the atomic scattering amplitudes of lead for (1) electron, (2) X-ray, and (3) neutron scattering (in absolute values)  (p. 188) | html | pdf |
      • Fig. 4.1.3.2. Relative dependence of the average atomic scattering amplitudes on the atomic number Z for X-rays (continuous line), electrons (dashed line), and neutrons (circles)  (p. 188) | html | pdf |
    • Tables
      • Table 4.1.3.1. Average diffraction properties of X-rays, electrons, and neutrons  (p. 187) | html | pdf |