International Tables for Crystallography (2006). Vol. C, ch. 7.5, pp. 666-676
doi: 10.1107/97809553602060000608

Chapter 7.5. Statistical fluctuations

Contents

  • 7.5. Statistical fluctuations  (pp. 666-676) | html | pdf | chapter contents |
    • 7.5.1. Distributions of intensities of diffraction  (p. 666) | html | pdf |
    • 7.5.2. Counting modes  (p. 666) | html | pdf |
    • 7.5.3. Fixed-time counting  (pp. 666-667) | html | pdf |
    • 7.5.4. Fixed-count timing  (p. 667) | html | pdf |
    • 7.5.5. Complicating phenomena  (p. 667) | html | pdf |
      • 7.5.5.1. Dead time  (p. 667) | html | pdf |
      • 7.5.5.2. Voltage fluctuations  (p. 667) | html | pdf |
    • 7.5.6. Treatment of measured-as-negative (and other weak) intensities  (p. 667) | html | pdf |
    • 7.5.7. Optimization of counting times  (pp. 667-668) | html | pdf |
    • References | html | pdf |