Figure 2.5.2.2

Cowley, J. M.

doi:10.1107/97809553602060000558

International
Tables for
Crystallography
Volume B
Reciprocal space
Edited by U. Shmueli

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International Tables for Crystallography (2006). Vol. B. ch. 2.5, p. 282 | 1 | 2 |

Figure 2.5.2.2

J. M. Cowley^a ^‡

Figure 2.5.2.2

Diagram representing the critical components of a conventional transmission electron microscope (TEM) and a scanning transmission electron microscope (STEM). For the TEM, electrons from a source A illuminate the specimen and the objective lens forms an image of the transmitted electrons on the image plane, B. For the STEM, a source at B is imaged by the objective lens to form a small probe on the specimen and some part of the transmitted beam is collected by a detector at A.