Figure 2.3.3.1

Parrish, W.; Langford, J. I.

doi:10.1107/97809553602060000578

International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

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International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 61

Figure 2.3.3.1

W. Parrish^a ^‡ and J. I. Langford^b

^a IBM Almaden Research Center, San Jose, CA, USA, and ^bSchool of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

Figure 2.3.3.1

Differences in relative intensities due to preferred orientation as seen in synchrotron X-ray patterns of m-chlorobenzoic acid obtained with a specimen in reflection and transmission compared with calculated pattern. Peaks marked × are impurities, O absent in experimental patterns.