Powder and related techniques: X-ray techniques

Parrish, W.; Langford, J. I.

doi:10.1107/97809553602060000578

Aberrations

geometrical 2.3.1.1.4, 2.3.1.1.4

in powder diffractometry 2.3.1.1.4, 2.3.1.1.4, 2.3.1.1.6, 2.3.1.1.6, 2.3.1.1.8, 2.3.1.1.8

physical 2.3.1.1.4, 2.3.1.1.4

transparency 2.3.1.1.6, 2.3.1.1.6

Absorption

air 2.3.5.1.4

factor 2.3.1.2

Air absorption 2.3.5.1.4

Air and window transmission 2.3.5.1.4

Air scattering 2.3.5.1.4

Alignment and angular calibration 2.3.1.1.3

Angle definition

use of peak or centroid for 2.3.3.3

Antiscatter slits 2.3.1.1.1

Asymmetry

of peaks 2.3.3.8

Automation

computer-controlled 2.3.3.5

Axial divergence 2.3.1.1.1, 2.3.1.1.7, 2.3.1.3

Background 2.3.3.8

Backlash in diffractometer drives 2.3.1.1.3

Balanced filters 2.3.5.1.5, 2.3.5.4.2, 2.3.5.4.2, 2.3.5.3

Beam centring 2.3.1.1.1

Beam divergence 2.3.1.1.1

Bent crystals 2.3.5.4.1

Bragg–Brentano (Parrish) angle-dispersive diffractometers 2.3.1.1

Calculated powder patterns 2.3.3

Cameras

back-reflection 2.3.4.3

cylindrical 2.3.4, 2.3.4.1

Debye–Scherrer 2.3, 2.3.4.1

flat-film 2.3.4.3

Gandolfi 2.3.4.3

Guinier focusing 2.3.1, 2.3.3.8, 2.3.4, 2.3.4.2

miscellaneous 2.3.4.3

powder 2.3.4

Cauchy curves 2.3.3.8

Channel-cut monochromators 2.3.5.4.1

Combined aberrations 2.3.1.1.8

Computer-controlled automation 2.3.3.5

Confidence level 2.3.3.6

Convolution 2.3.3.8

Convolution equations 2.3.3.8

Convolution range 2.3.3.7

Counting statistics 2.3.3.6

Crystal(s)

analysers 2.3.2.1

monochromators 2.3.5.4.1

Crystallite-size effects 2.3.3.1.2

Cylindrical camera 2.3.4, 2.3.4.1

Cylindrical powder cameras 2.3.4.1

Cylindrical powder specimens 2.3.2.2

Cylindrical sample

2θ scan 2.3.2.2

Debye–Scherrer camera 2.3.4.1

Debye–Scherrer–Hull method 2.3

Depth-profiling analysis 2.3.2.3

Diffraction

grazing-incidence 2.3.2.3

Diffractometers

alignment 2.3.1.1.3

for powder diffraction 2.3

operation control 2.3.3.5

profiles 2.3.1.8

Dispersion 2.3.5.2.1

Empirical correction factor for preferred orientation 2.3.3.1.1

Energy-dispersive

diffraction 2.3.2.4

Entrance slit 2.3.1.1.1

Filters 2.3.5.3

balanced 2.3.5.1.5, 2.3.5.4.2

for common target elements 2.3.5.4.2, 2.3.5.3

single 2.3.5.4.2

thickness 2.3.5.4.2

First/second derivatives 2.3.3.7, 2.3.3.7

Flat crystal 2.3.5.4.1

Flat-film camera for Laue patterns 2.3.4

Flat-specimen aberration 2.3.1.1.3, 2.3.1.1.6

Fluctuations

in particle orientation 2.3.3.1.1

Focal-line width 2.3.1.1.5

Focusing diffractometer geometries 2.3.1

Focusing powder camera 2.3.4.2

Gaussian curves 2.3.3.8

Generator stability 2.3.5.1.1

Geometrical instrument parameters 2.3.1.1.1

Graphite

monochromator 2.3.1.2

Grazing-incidence diffraction 2.3.2.3

Guinier focusing 2.3.4.2

High-resolution energy-dispersive diffraction 2.3.2.4

Horizontal Soller slits 2.3.2.1

Incidence aperture 2.3.1.3

Incident-beam monochromator 2.3.1.4

Instrument broadening and aberrations 2.3.1.1.4

Instrument parameters, geometrical 2.3.1.1.1

Intensity

variation with take-off angle 2.3.5.1.5

Irradiated specimen length 2.3.1.1.1, 2.3.1.4

Kα doublet 2.3.3.2

Laue patterns

flat-film camera for recording 2.3.4

Lorentzian curves 2.3.3.8

Lorentzian profiles 2.3.3.8

Lorentz–polarization factor, errors 2.3.3

Microanalysis 2.3.1.5

Microdiffractometry 2.3.1.5

Microfocus sources 2.3.5.1

Monitor methods 2.3.5.1.1

Monochromatic radiation, θ–2θ scan 2.3.2.1

Monochromators 2.3.1.1, 2.3.1.1.2, 2.3.1.2, 2.3.5.4.1

alignment 2.3.1.1.3

angular calibration 2.3.1.1.3

channel-cut 2.3.5.4.1

common types 2.3.5.4.1

crystal 2.3.5.4.1

different diffraction geometries 2.3.1

diffracted beam 2.3.1.3, 2.3.1.1.2

incident-beam 2.3.1.4

pyrolytic graphite 2.3.1.1.2, 2.3.5.4.1

Moseley's law 2.3.5.4, 2.3.5.2

Neutron powder data 2.3.3.8

Parafocusing 2.3.1.1.4

Parallel-beam geometry 2.3.2

Particle size 2.3.3.1.2

Peak

asymmetry 2.3.3.8

satellite 2.3.5.2

search 2.3.3.7

Peak-to-background ratio 2.3.3.6

Pearson VII function 2.3.3.8

Penetration depth 2.3.2.3

Phase identification 2.3

Polarization factor 2.3.1.2

Powder cameras 2.3.4

Powder diffraction 2.3

advantages of synchrotron 2.3.2

methods, basic 2.3.2

Powder patterns

calculation of 2.3.3

computer graphics for 2.3.3.9

Preferred orientation 2.3.3.1.1

empirical correction factor 2.3.3.1.1

minimization of 2.3.3.1.1

Profile fitting 2.3.3.7, 2.3.3.8

functions 2.3.3.8

Pseudo-Voigt function 2.3.3.8

Pulse-amplitude discrimination 2.3.5.1.5

Pyrolytic graphite 2.3.1, 2.3.5.4.1

Radionuclides 2.3.5.3

Rate-meter measurements 2.3.3.4

Receiving slit 2.3.1.1.1

aperture 2.3.1.3

width 2.3.1.1.5

Recording range 2.3.1.3

Refinement

Rietveld 2.3.2.1

Reflection specimen

θ–2θ scan 2.3.1.1, 2.3.1.4

R factors 2.3.3.8

weighted 2.3.3.8

Rietveld method 2.3.2.1

Rotating-anode tubes 2.3.5.1

Satellite

peaks 2.3.5.2

Screen menu (CRT) for diffractometer-operation control 2.3.3.5

Seemann–Bohlin geometry 2.3.1

Seemann–Bohlin method 2.3.1.3

advantages 2.3.1.3

Self-centring slit 2.3.1.1.1

Setting

θ–2θ 2.3.1.1.3

Single filters 2.3.5.4.2

Slits

antiscatter 2.3.1.1.1

design 2.3.1.1.1, 2.3.1.5

self-centring 2.3.1.1.1

Small particles

essential 2.3.2.1

line broadening from 2.3.3.1.2

Soller slits 2.3.1.1.1, 2.3.2.1

Source intensity distribution and size 2.3.5.1.3

Specimen

aberrations 2.3.1.1.6

factors 2.3.3.1

fluorescence 2.3.1, 2.3.5.4.1

focusing circle 2.3.1.1.1

irradiated length 2.3.1.1.1, 2.3.1.4

orientation 2.3.1.2

surface displacement 2.3.1.1.6

transparency aberration 2.3.1.1.8

Spectral profiles 2.3.1.8

Spectral purity 2.3.5.1.2

Stability of X-ray sources 2.3.5.1.1

Statistical fluctuations 2.3.3.9

Step size and count time 2.3.3.5

Strip-chart recordings 2.3.3.4

Synchrotron radiation 2.3.2

Take-off angle 2.3.5.1.5

Transmission method, advantage of 2.3.1.2

Transmission specimen, θ–2θ scan 2.3.1.2

Transparency aberration 2.3.1.1.6

Voigt function 2.3.3.8

Wavelength calibration 2.3.2.1

Wavelength selection 2.3.5.2.1

easy 2.3.2

Weak-peak measurement 2.3.3.7

Weighted R factors 2.3.3.8

Whole-powder-pattern fitting 2.3.3.8

X-ray generators 2.3.5.1, 2.3.5.1.1

X-ray powder techniques 2.3

aberrations in 2.3.1.1.4, 2.3.1.1.6, 2.3.1.1.8

energy-dispersive 2.3.2.4

filters 2.3.5.4.2

focusing geometries 2.3.1

history 2.3

literature 2.3

microdiffractometry 2.3.1.5

monochromators in 2.3.1, 2.3.5.4.1

parallel-beam geometries 2.3.2

Seemann–Bohlin geometry 2.3.1, 2.3.1.3

Soller slits in 2.3.1.1.7, 2.3.2.1

specimen fluorescence in 2.3.1

zero position 2.3.1.1.3

X-ray spectra 2.3.5, 2.3.5.2

X-ray tubes 2.3.5.1

Chapter 2.3. Powder and related techniques: X-ray techniques

Chapter index