International
Tables for Crystallography Volume C Mathematical, physical and chemical tables Edited by E. Prince © International Union of Crystallography 2006 |
International Tables for Crystallography (2006). Vol. C. ch. 2.9, pp. 128-129
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Neutron reflectivity measurements can be carried out in two principal ways: either (1) with a monochromatic incident beam of narrow angular divergence in the plane of reflection (defined by and where λ is constant, and Q is varied by changing the glancing angle of incidence, θ, relative to the sample surface; or (2) using a pulsed polychromatic incident beam, also of narrow angular divergence at fixed , and obtaining data over a range of Q values simultaneously by performing time-of-flight analysis on the reflected neutrons. For either method, the instrumental resolution is simply given as where Δ is the angular divergence of the reflected beam, and Δλ is the wavelength spread. In the case of a steady-state source, the wavelength resolution is determined by the monochromator, whereas the timing and moderator characteristics determine the wavelength resolution on a time-of-flight instrument. Although the second term in equation (2.9.5.1) is standard in scattering, it has a unique characteristic, in that the angular divergence of the reflected beam determines the resolution. This is the case because the sample is a δ-function scatterer, so that the angle of the incident beam can be determined precisely by knowing the reflected angle (Hamilton, Hayter & Smith, 1994). For a more complete description of both types of neutron reflectometry instrumentation, see Russell (1990).
References
Hamilton, W. A., Hayter, J. B. & Smith, G. S. (1994). Neutron reflectometry as optical imaging. J. Neutron Res. 2, 1–19.Google ScholarRussell, T. P. (1990). X-ray and neutron reflectivity for the investigation of polymers. Mater. Sci. Rep. 5, 171–271.Google Scholar