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INTERNATIONAL TABLES for CRYSTALLOGRAPHY |
Volume G |
Definition and Exchange of Crystallographic Data |
Powder diffraction creates new demands for versatility in CIF. Unlike single-crystal experiments, where raw data can be automatically reduced to an instrument-independent form (structure factors), powder-diffraction data will always be instrument dependent, and there is a wide array of instrumentation:
pdCIF has other special needs:
Since powder diffraction may be used for non-crystallographic purposes, such as phase identification, the data themselves may be the result.
For classification purposes, the pdCIF dictionary is divided in sections. Few pdCIFs will have entries defined for all sections. The use of each section and the component data items are presented on a section-by-section basis, describing: the experimental configuration; sample preparation, characterization and mounting details; references to calibration information; the experimental (raw) diffraction data set; the processed diffraction data set; calculated diffractogram; peak table; reflection assignments and intensities; derived structural results. The use of the different data items is shown through examples.
The following CIF dictionary is referenced in this chapter:
The following programs are referenced in this chapter:
The following template and example files may be of use in association with this chapter:
Finger, L. W., Cox, D. E. &
Jephcoat, A. P.
(1994). A correction for powder diffraction peak asymmetry due
to axial divergence. J. Appl. Cryst. 27, 892-900.
HDF (1998). NCSA HDF home page. http://hdf.ncsa.uiuc.edu/.
International Centre for Diffraction Data (1999). Powder Diffraction File. International Centre for Diffraction Data, 12 Campus Boulevard, Newtown Square, Pennsylvania, USA. http://www.icdd.com.
Le Bail, A., Duroy, H. & Fourquet, J. L. (1988). Ab initio structure determination of LiSbWO6 by X-ray powder diffractometry. Mater. Res. Bull. 23, 447-452.
NeXus (1999). NeXus data format. http://www.nexus.anl.gov.
Pawley, G. S. (1981). Unit-cell refinement
from powder diffraction scans. J. Appl. Cryst.
14, 357-361.
Rietveld, H. M. (1967). Line profiles of
neutron powder-diffraction peaks for structure refinement.
Acta Cryst. 22, 151-152.
Rietveld, H. M. (1969). A profile refinement
method for nuclear and magnetic structures. J. Appl. Cryst.
2, 65-71.
Toby, B. H. (2003). CIF applications. XII.
Inspecting Rietveld fits from pdCIF: pdCIFplot. J. Appl.
Cryst. 36, 1285-1287.
See also
http://www.ncnr.nist.gov/xtal/software/cif/pdCIFplot.html.
Toby, B. H., Von Dreele, R. B. &
Larson, A. C. (2003). CIF applications. XIV. Reporting of Rietveld
results using pdCIF: GSAS2CIF. J. Appl. Cryst. 36,
1290-1294.
See also
http://www.ncnr.nist.gov/xtal/software/expgui/gsas2cif.html.
Copyright © 2005 International Union of Crystallography