|
INTERNATIONAL TABLES for CRYSTALLOGRAPHY |
Volume G |
Definition and Exchange of Crystallographic Data |
Definition:
The criterion used to classify a reflection as 'observed'. This criterion is usually expressed in terms of a sigma(I) or sigma(F) threshold.Example:
| >2sigma(I) |
Type: text
Mandatory item: no
Alias:Related items: _reflns.observed_criterion_sigma_F (alternate)
_reflns.observed_criterion_sigma_I (alternate)
_reflns.observed_criterion_I_min (alternate)
_reflns.observed_criterion_I_max (alternate)
_reflns.observed_criterion_F_min (alternate)
_reflns.observed_criterion_F_max (alternate)
Category: reflns
Copyright © 2005 International Union of Crystallography