International Tables for Crystallography (2019). Vol. H. ch. 2.4, pp. 102-117
https://doi.org/10.1107/97809553602060000939

Chapter 2.4. Electron powder diffraction

Contents

  • 2.4. Electron powder diffraction  (pp. 102-117) | html | pdf | chapter contents |
    J.-M. Zuo, J. L. Lábár, J. Zhang, T. E. Gorelik and U. Kolb
    • 2.4.1. Introduction  (pp. 102-103) | html | pdf |
    • 2.4.2. Electron powder diffraction pattern geometry and intensity  (pp. 103-104) | html | pdf |
      J.-M. Zuo and J. L. Lábár
    • 2.4.3. Electron powder diffraction techniques  (pp. 105-108) | html | pdf |
      J.-M. Zuo and J. Zhang
      • 2.4.3.1. Selected-area electron diffraction (SAED)  (p. 105) | html | pdf |
      • 2.4.3.2. Nano-area electron diffraction (NAED)  (pp. 105-106) | html | pdf |
      • 2.4.3.3. Sample preparation  (pp. 106-107) | html | pdf |
      • 2.4.3.4. Diffraction data collection, processing and calibration  (pp. 107-108) | html | pdf |
    • 2.4.4. Phase identification and phase analysis  (pp. 108-110) | html | pdf |
      J. L. Lábár
    • 2.4.5. Texture analysis  (pp. 110-111) | html | pdf |
      J. L. Lábár
    • 2.4.6. Rietveld refinement with electron diffraction data  (pp. 111-113) | html | pdf |
      T. E. Gorelik and U. Kolb
    • 2.4.7. The pair distribution function from electron diffraction data  (pp. 113-114) | html | pdf |
      T. E. Gorelik and U. Kolb
    • 2.4.8. Summary  (p. 114) | html | pdf |
    • Appendix 2.4.1. Computer programs for electron powder diffraction  (pp. 114-115) | html | pdf |
    • References | html | pdf |
    • Figures
      • Fig. 2.4.1. An electron powder diffraction pattern recorded on an imaging plate from a polycrystalline Al thin film using selected-area electron diffraction geometry with 200 kV electrons  (p. 102) | html | pdf |
      • Fig. 2.4.2. Schematic diagram of the Ewald sphere construction and the geometry for recording electron diffraction patterns  (p. 103) | html | pdf |
      • Fig. 2.4.3. Schematic illustration of selected-area electron diffraction in conventional TEM  (p. 105) | html | pdf |
      • Fig. 2.4.4. Schematic illustration of electron nanoprobe formation using a combination of condenser lenses (II and III) and the objective lens  (p. 106) | html | pdf |
      • Fig. 2.4.5. Sample preparation and lift-out using a focused ion beam (FIB)  (p. 106) | html | pdf |
      • Fig. 2.4.6. An example of electron powder diffraction recording for nanodiamonds  (p. 108) | html | pdf |
      • Fig. 2.4.7. Rietveld analysis result with powder electron diffraction data of hydroxyapatite  (p. 111) | html | pdf |
      • Fig. 2.4.8. Powder electron diffraction pattern of nanocrystalline gold demonstrating non-symmetrical background features  (p. 111) | html | pdf |
      • Fig. 2.4.9. Electron powder diffraction profiles of gold nanoparticles (range 2–6 nm−1) recorded at different electron diffraction camera lengths  (p. 112) | html | pdf |