International Tables for Crystallography (2019). Vol. H. ch. 3.3, pp. 263-269
https://doi.org/10.1107/97809553602060000948

Chapter 3.3. Powder diffraction peak profiles

Contents

  • 3.3. Powder diffraction peak profiles  (pp. 263-269) | html | pdf | chapter contents |
    R. B. Von Dreele
    • 3.3.1. Introduction  (p. 263) | html | pdf |
    • 3.3.2. Peak profiles for constant-wavelength radiation (X-rays and neutrons)  (pp. 263-265) | html | pdf |
      • 3.3.2.1. Introduction – symmetric peak profiles  (pp. 263-264) | html | pdf |
      • 3.3.2.2. Constant-wavelength powder profile asymmetry  (p. 264) | html | pdf |
      • 3.3.2.3. Peak-displacement effects  (pp. 264-265) | html | pdf |
      • 3.3.2.4. Fundamental parameters profile modelling  (p. 265) | html | pdf |
    • 3.3.3. Peak profiles for neutron time-of-flight experiments  (pp. 265-266) | html | pdf |
      • 3.3.3.1. The experiment  (p. 265) | html | pdf |
      • 3.3.3.2. The neutron pulse shape  (pp. 265-266) | html | pdf |
      • 3.3.3.3. The neutron TOF powder peak profile  (p. 266) | html | pdf |
    • 3.3.4. Peak profiles for X-ray energy-dispersive experiments  (pp. 266-267) | html | pdf |
    • 3.3.5. Sample broadening  (pp. 267-268) | html | pdf |
      • 3.3.5.1. Crystallite size broadening  (p. 267) | html | pdf |
      • 3.3.5.2. Microstrain broadening  (pp. 267-268) | html | pdf |
    • References | html | pdf |
    • Figures
      • Fig. 3.3.1. The band of intensity diffracted by a sample with height 2S, as seen by a detector with opening 2H and a detector angle 2φ moving in the detector cylinder  (p. 264) | html | pdf |
      • Fig. 3.3.2. Low-angle synchrotron powder diffraction line (2θ ≃ 4.1°) fitted by the Finger et al  (p. 264) | html | pdf |
      • Fig. 3.3.3. The observed and calculated Ni 222 diffraction line profile from the Back Scattering Spectrometer, Harwell Laboratory, Chilton, UK  (p. 266) | html | pdf |
      • Fig. 3.3.4. Microstrain surface for sodium parahydroxybenzoate multiplied by 106  (p. 268) | html | pdf |