Solid-state detectors
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 7.1.4.2,
pp. 620-620
[ doi:10.1107/97809553602060000604 ]
[
more
results from section 7.1.4 in volume C]
Proportional counters
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 7.1.3.2,
pp. 619-619
[ doi:10.1107/97809553602060000604 ]
[
more
results from section 7.1.3 in volume C]
Geiger counters
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 7.1.2,
pp. 618-619
[ doi:10.1107/97809553602060000604 ]
Powder and related techniques: X-ray techniques
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
ch. 2.3,
pp. 42-79
[ doi:10.1107/97809553602060000578 ]
Spectral purity
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 2.3.5.1.2,
pp. 72-72
[ doi:10.1107/97809553602060000578 ]
& Parrish, 1959). The contaminating elements can be identified from the extra peaks. It is advisable to check the spectral purity when the tube is new and periodically thereafter.
References
Ladell, J. &
Parrish,
W. (1959 ...
[
more
results from section 2.3.5 in volume C]
Use of peak or centroid for angle definition
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 2.3.3.3,
pp. 63-63
[ doi:10.1107/97809553602060000578 ]
the Bragg equation becomes nonlinear in the sense that the 1:1 correspondence between λ and is lost.
References
Ladell, J.,
Parrish,
W. & Taylor, J. (1959). Interpretation of diffractometer line profiles. Acta Cryst. 12 ...
[
more
results from section 2.3.3 in volume C]
Powder cameras
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 2.3.4,
pp. 70-71
[ doi:10.1107/97809553602060000578 ]
& Werner, P. E. (1973). Automatic densitometer measurement of powder diffraction photographs. Acta Chem. Scand. 27, 493–502. Google Scholar
Parrish,
W. (1955). Elimination of the second image in double-coated film. Norelco Rep. 2 ...
[
more
results from section 2.3.4 in volume C]
Grazing-incidence diffraction
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 2.3.2.3,
pp. 58-58
[ doi:10.1107/97809553602060000578 ]
intensity is an order of magnitude lower than (a).
References
Lim, G.,
Parrish,
W., Ortiz, C., Bellotto, M. & Hart, M. (1987). Grazing incidence synchrotron X-ray diffraction method for analyzing thin films. J. Mater ...
[
more
results from section 2.3.2 in volume C]
Combined aberrations
Parrish, W. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 2.3.1.1.8,
pp. 50-50
[ doi:10.1107/97809553602060000578 ]
[
more
results from section 2.3.1 in volume C]
X-ray diffraction methods: polycrystalline
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
ch. 5.2,
pp. 491-504
[ doi:10.1107/97809553602060000596 ]
J. Cryst. Growth, 55, 409–427. Google Scholar
Hart, M., Cernik, R.,
Parrish,
W. & Toraya, H. (1990). Lattice parameter determination for powders using synchrotron radiation. J. Appl. Cryst. 23, 286–291. Google Scholar ...
