International Tables for Crystallography (2006). Vol. C. ch. 5.3, pp. 505-536
https://doi.org/10.1107/97809553602060000597 |
Chapter 5.3. X-ray diffraction methods: single crystal
Chapter index
Accuracy of lattice-parameter (lattice-spacing) determination 5.3.1.1, 5.3.1.1, 5.3.1.2, 5.3.1.2, 5.3.1.2, 5.3.1.2, 5.3.1.2, 5.3.1.2
relative 5.3.1.1
Arrangements giving partial reduction of systematic errors 5.3.4
Bond method 5.3.1.2
Characteristic X-rays
excitation 5.3.2.4.1
Comparison measurements of lattice parameters 5.3.1.2
Conical surface of an hkl reflection 5.3.2.4.1
Crystal profile 5.3.1.1
Crystal thickness
in transmission geometry 5.3.2.4.1
Data-processing
single-crystal methods 5.3.1.1
Defects
study of 5.3.1.1
Double-crystal spectrometers
with photographic recording 5.3.2.3.5
Effect on lattice parameters (examination)
of pressure 5.3.1.2
Eigenvalue filtering 5.3.2.3.4
Energy-dispersive
methods, in lattice-spacing determination 5.3.1.2
Epitaxic layers, study of 5.3.2.4.4
Excitation of characteristic X-rays 5.3.2.4.1
High-angle Bragg reflections
in lattice-parameter determination 5.3.2.3.4
Kβ line in lattice-spacing determination 5.3.1.2
Lattice-parameter determination 5.3.1.1
absolute 5.3.1.1
from one crystal mounting 5.3.2.3.3
from separate photographs 5.3.2.3.1
of large flat slab 5.3.1.2
of polycrystals (Kossel method) 5.3.2.4.4
of single crystals 5.3.1.1
of small spherical crystals 5.3.1.2
of standard crystal 5.3.1.2
preliminary 5.3.1.2
relative 5.3.1.1
Lattice-parameter differences
determination of 5.3.1.2
Laue photography
combined with powder diffraction 5.3.1.1
Lens configuration 5.3.2.4.2
Measured profile 5.3.1.1
Misalignment 5.3.1.2
Multiple diffraction 5.3.2.4.2
Multiple-diffraction methods
with photographic recording 5.3.2.4.2
Original profile 5.3.1.1
Perfect single crystals 5.3.2.3.5
Phase diagrams, determination of 5.3.2.3.5
Phase transitions, study of 5.3.2.3.5
Powder diffraction
combined with Laue photography 5.3.1.1
Pressure, effect on lattice parameters
study of 5.3.1.2
Profile fitting
in oscillation photographs 5.3.2.3.4
Pseudo-non-dispersive methods 5.3.1.2
radiation
elimination 5.3.2.3.5
Reciprocal cell
picture of, three-dimensional 5.3.2.3.3
picture of, two-dimensional 5.3.2.3.2
picture of, undeformed 5.3.2.3.2
Reciprocal lattice
geometry 5.3.2.4.2
Refraction
correction for 5.3.1.1
Relative measurements of lattice spacing 5.3.1.1
Single-crystal X-ray techniques 5.3.1.1
Small spherical crystals
lattice-parameter determination of 5.3.1.2
Sources of X-radiation 5.3.1.2
Spectrometers
double-crystal 5.3.2.3.5
Statistical errors
of lattice-parameter determination 5.3.1.1
Stereographic projection of Kossel pattern 5.3.2.3
Strain, measurement of 5.3.2.3.5
Strainmeter 5.3.2.3.5
Straumanis film mounting 5.3.2.3.4
Stress
study of 5.3.2.3.5
Symmetric arrangement in single-crystal methods 5.3.2.3.4
Systematic errors
in divergent-beam methods 5.3.2.4.3
in photographic methods 5.3.2.4.3
reduced by detailed analysis of Kossel patterns 5.3.2.4.2
Temperature dependence of lattice parameters
examination 5.3.1.2
Thermal effects, error connected with 5.3.2.4.3
Umweganregung 5.3.3.6
X-ray beam
in single-crystal techniques 5.3.1.2