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International Tables for Crystallography (2006). Vol. C. ch. 8.8, pp. 735-743
https://doi.org/10.1107/97809553602060000616 |
Chapter 8.8. Accurate structure-factor determination with electron diffraction
Contents
- 8.8. Accurate structure-factor determination with electron diffraction (pp. 735-743) | html | pdf | chapter contents |
- References | html | pdf |
- Figures
- Fig. 8.8.1. Schematic representations of four convergent-beam configurations used for structure-factor determination: (a) intensity profile of a low-order reflection, g; (b) non-systematic three- or four-beam configuration with a strong coupling reflection, h; (c) symmetric many-beam configuration in a dense zone; (d) integrated intensity measurement of high-order reflections using a wide aperture (Taftø & Metzger, 1985) (p. 736) | html | pdf |