International
Tables for
Crystallography
Volume I
X-ray absorption spectroscopy and related techniques
Edited by C. T. Chantler, F. Boscherini and B. Bunker

International Tables for Crystallography (2024). Vol. I. ch. 6.5, pp. 744-751
https://doi.org/10.1107/S1574870720003262

Chapter 6.5. EXCURVE

Martin C. Feiters,a* Richard W. Strangeb and Norman Binstedc

aInstitute for Molecules and Materials, Radboud University, Heyendaalseweg 135, 6525 AJ Nijmegen, The Netherlands,bSchool of Biological Sciences, University of Essex, Wivenhoe Park, Colchester CO4 3SQ, United Kingdom, and c7 Cavendish Close, Romsey SO51 7HT, United Kingdom
Correspondence e-mail:  [email protected]

The theoretical background of the EXAFS simulation program EXCURVE is described, as well as its simulations, refinement and analysis methods, and these are put in perspective.

Keywords: EXCURVE; EXAFS simulation; multiple scattering; disorder.

1. Introduction: EXCURVE in perspective

X-ray absorption spectroscopy (XAS), including X-ray absorption near-edge structure (XANES) and extended X-ray absorption fine structure (EXAFS or XAFS), took off in the 1970s as a technique to study the structures of materials that were not amenable to single-crystal X-ray diffraction. The availability of synchrotrons as a source of brilliant tuneable X-rays coincided with the notion (Sayers et al., 1971link to reference) that Fourier transformation of the spectrum yields a radial distribution function that gives the distances of atoms from the absorber atom (see Section 2link to section). An established theoretical framework based on low-energy electron diffraction (Pendry, 1974link to reference) served as inspiration for exact theories (Lee & Pendry, 1975link to reference; Ashley & Doniach, 1975link to reference). Early EXAFS was interpreted using the plane-wave approximation (Teo & Joy, 1981link to reference; Koningsberger & Prins, 1988link to reference; Stern et al., 1975link to reference; Lee & Beni, 1977link to reference; Stern, 1974link to reference; Citrin et al., 1976link to reference; Teo et al., 1977link to reference) in either a Fourier-fitting or curve-fitting approach. These neglected the computationally more complex curvature of the electron wave, giving poor agreement between simulation and experiment in the low-energy region. Nevertheless, these early results are reliable insofar as they deal with strong backscatterers in systems where only single scattering is important.

EXCURVE was a joint effort of theoreticians and programmers led by John Pendry at the first dedicated second-generation synchrotron storage ring, the Synchrotron Radiation Source at the Daresbury Laboratory, UK, and its user community. The first interactive version of the program was EXINT (Gurman, 1980link to reference). The incorporation of fast spherical wave theory into EXINT was a major advance because it used exact curved-wave theory with an efficient angle-averaging procedure: the fast spherical wave method (Gurman et al., 1984link to reference). Further development by Binsted led to a command-based program, which was named EXCURVE by E. Pantos. Before this there were very few examples of EXAFS simulations that did not use the plane-wave approximation: exact calculations of, for example, As2O3, were computationally demanding (Gurman & Pettifer, 1979link to reference). Subsequent versions of EXCURVE included multiple scattering (up to third order; EXCURV86; Gurman et al., 1986link to reference; subsequently extended to fifth order), the small-atom approximation (EXCURV88; Gurman, 1988link to reference; Rehr & Albers, 1990link to reference), constrained refinement (EXCURV90) and restrained refinement (EXCURV92; Binsted et al., 1992link to reference). EXCURV98 included multiple cluster methods, point-group symmetry, 3D refinement, amino-acid and ligand databases, and anharmonicity. Options for modelling surfaces (including exact polarization effects), commands for visualizing clusters and ligands, and whole-spectrum XAS analysis (Binsted & Hasnain, 1996link to reference) are also available in EXCURVE.

In the 1990s, the alternative EXAFS programs FEFF (Rehr et al., 1991link to reference; Zabinsky et al., 1995link to reference; Kas et al., 2024link to reference) and GNXAS (Filipponi & Di Cicco, 1995link to reference; Filipponi et al., 2024link to reference) became available. These are based, like EXCURVE, on Fermi's golden rule and electron Green's functions and take the curvature of the electron wave into account, but differ in the details of their subsequent treatments (Ravel, 2016link to reference). A fruitful dialogue with the developers of FEFF led to the incorporation into EXCURVE of the Rehr–Albers approach for multiple scattering and the Hedin–Lundqvist potential and exchange. EXCURV98 was made available as DL_EXCURV using the DL Visualize (DLV) graphical interface (Tomic et al., 2004link to reference). EXCURVE has unique features, such as constrained and restrained refinement (Binsted et al., 1992link to reference) and its combination with powder diffraction (Binsted et al., 1996link to reference). It has been used for automated analysis of bioXAFS data in ABRA (Automated BioXAS Refinement and Analysis; Wellenreuther et al., 2010link to reference) and continues to serve a distinct group of users. A crude bibliometric approach (Fig. 1link to figure) suggests that the fraction of the total EXAFS output analysed with exact curved-wave theory among available software remains remarkably and disappointingly low.

[Figure 1]

Figure 1

Number of publications on EXAFS (white; topic EXAFS, scaled by a factor of 0.20), EXCURVE (black; citation of Gurman et al., 1984link to reference), FEFF (dark grey; citation of Rehr et al., 1991link to reference) and GNXAS (light grey; citation of Filipponi & Di Cicco, 1995link to reference) in the years 1971–2020. Source: Clarivate Web of Science (April 2020).

2. Theoretical background in EXCURVE

EXCURVE calculates the structure in the absorption coefficient for a photon of energy E within a single-particle formalism using the dipole approximation (Stern, 1988link to reference),Mathematical equationwhere Nα is the number of atoms per unit volume, ρ(Ef) is the density of final states, |i〉 is the initial core state with energy Ei, |f〉 is the final state with energy Ef = Ei + hω, where hω is the photon energy and z is the form of the dipole operator Mathematical symbol for the unpolarized case, with e the electric vector of the photon and r the position with respect to the atomic nucleus. The initial state is the core state of energy Ec in the unperturbed atom and the final state is a photoelectron wavefunction which includes the effect of scattering by surrounding atoms. μ(E) is related by equation (2)link to equation to μ0, the absorption coefficient due to the absorbing atom alone, which is normally, but not necessarily, removed by background subtraction, isolating the oscillatory component χ,Mathematical equation

The calculation of χ follows the general method of Lee & Pendry (1975link to reference) where, for amorphous or polycrystalline samples, the scattering contributions for a specific final state l are of the form (the real part of the expression is taken)Mathematical equationwhere Z is a sum over terms for single, double scattering etc. The final term defines the change in phase due to the passage of the photoelectron in and out of the central atom potential. Z is usually calculated using the angle-averaged `fast spherical wave' method (Gurman et al., 1984link to reference, 1986link to reference), in which each single-scattering atom contribution is given byMathematical equationwhere the lth element of T isMathematical equationThe Hankel functions h depend on the interatomic distances, and the matrices T on the scattering phase shifts δl for each atom. T is diagonal as the phase shifts are calculated from a spherically symmetric potential. The 3J coefficient is that of Brink & Satchler (1968link to reference), also given by Zare (1988link to reference). The l sums are strongly restricted by rules on angular momentum coupling.

Where a site may be statistically occupied, as in a metal alloy, it is possible to define a `mixed-site atom' and use this to generate the T matrix. For the more general case requiring polarization dependence, the angular part of the dipole matrix elements are required and the calculation is less efficient, unless the less accurate `small-atom' option (Gurman, 1988link to reference) is used. In general, for initial states of p or d symmetry, only the dominant transition ll + 1 is calculated; however, it is also possible to include the ll − 1 term provided that the atomic contributions are calculated at the same time as the phase shifts. Extrinsic losses, mainly due to two-electron transitions, are approximated by a constant amplitude factor.

2.1. Potential and phase-shift calculations

At the core of the EXAFS calculation are the atomic wavefunctions for the central (excited) atom and scattering atoms. From these a potential function is calculated, from which the scattering phase shifts δl for the photoelectron are calculated. In the earliest versions of the program phase shifts were calculated independently with the Daresbury program MUFPOT (Durham, 1987link to reference) using tabulated relativistic Clementi & Roetti (1974link to reference) or Herman & Skillmann (1963link to reference) wavefunctions. Phase-shift calculations are now performed within EXCURVE using charge-density functions, 4πr3ρ(r), where ρ(r) is the electron density, and they are tabulated on a logarithmic grid. These are derived from spherically averaged wavefunctions calculated using a modified version of Desclaux's Hartree–Fock–Dirac code (Desclaux, 1975link to reference).

Two options for treatment of the time-dependent screening of the core hole in the absorbing atom are available: the `Z + 1' and `relaxed' approximations. Both assume that the electrons within the atom have had time to adjust to the sudden change in the potential associated with photoemission. They are appropriate except in the very low k region, where the valence electrons relax more slowly, and the very high k region, where transit times may be of the order of the inner-shell relaxation times for the lightest elements.

In the Z + 1 approximation, the wavefunctions are those for the Z + 1 atom (for example, zinc is used to model copper). The charge density is then reduced by one electron for the core orbital, so the overall charge is that of the Z atom. In the `relaxed' (or 'screened-ion') approximation the atomic wavefunctions are calculated in the presence of a core hole and with an extra valence electron. Tables are available in EXCURVE for K to M5 edges (1s to 3d5/2 core electrons). For each of the two screening options, two sets of tables are available, one using the Xα exchange and correlation approximation with α = 1 (Slater exchange; Slater, 1967link to reference), and one using the approximation of von Barth & Hedin (1972link to reference). Atomic potentials are calculated from the charge densities using Poisson's equation.

In both MUFPOT and EXCURVE, the potentials for solids are calculated within the muffin-tin approximation using the Mattheis prescription (Mattheis, 1973link to reference; Clarke, 1984link to reference), where it is assumed that the potential has a constant value in the interstitial region between the potential wells that represent individual atoms. Overlapping of atomic potentials results in a lowering and flattening of the potential away from the atomic nuclei. Replacing the potential between atomic-like spheres (defined by the muffin-tin radius) by a constant value is an acceptable approximation for EXAFS, where scattering is dominated by the strongly varying potential near the nucleus. This model works well for close-packed solids that can be represented by a regular lattice of touching spheres, but is not suited to materials where metals are coordinated by organic ligands.

For neutral atom phase-shift calculations, EXCURVE always assumes a face-centred-cubic (f.c.c.) structure and uses six shells of atoms surrounding a central atom to represent the solid. No more than two atom types are used in any cluster and the potential for each atom type is calculated separately. Two calculations are required, one with a cluster composed of scattering atoms and one with excited and ground-state atoms. With two atom types it is simply assumed that shells of atoms alternate (for example Cu, O, Cu, O, …), although this is clearly a departure from a true f.c.c. structure. Default muffin-tin radii are tabulated but may be modified or refined. To calculate phase shifts for ions using a CsCl structure an additional Madelung term must be included.

The potentials obtained from the superposition of atoms take into account the (ground-state) exchange and correlation potential of the photoelectron, using the Xα or the von Barth and Hedin formula, depending on the choice made for the charge-density tables. The resulting interstitial potential will differ for each two-atom cluster in the set of atoms selected, which is inconsistent with a constant interstitial potential. This is corrected by repeating the potential calculation with a set target potential, for example the average of the two-atom potentials calculated in the `first round'. This adjusts the muffin-tin radii of the atoms to reach the target potential.

The calculated phase shifts are given by δl,Mathematical equationwhere h2 and h1 are Hankel functions of the first and second kinds, respectively, and L are logarithmic derivatives of the Schrödinger (or Dirac) wavefunction at the muffin-tin radius (R), given byMathematical equationThe calculation is based on the Fox and Goodwin method of integration (Fox & Goodwin, 1949link to reference), with relativistic corrections to the photoelectron energy and momentum but ignoring spin–orbit coupling. 26 phase shifts (l = 0–25) are calculated.

Rehr and coworkers showed that the complex inner potential varies with photoelectron energy and modelled it using a Hedin–Lundqvist exchange and correlation potential (Hedin & Lundquist, 1969link to reference; Lee & Beni, 1977link to reference; Lu et al., 1989link to reference; Rehr et al., 1991link to reference). This was implemented in EXCURVE using code for the excited-state exchange term from FEFF (Rehr et al., 1986link to reference, 1991link to reference) with the permission of the authors. This results in complex phase shifts and a complex self-energy calculated relative to the Fermi energy. The effect of the core-hole lifetime (core width) is explicitly included as a separate term using tabulated values based on photoelectron spectroscopy (Rahkonen & Krause, 1974link to reference) as a starting point. This may be modified using an additional term to account for experimental resolution. The method adopted by FEFF calculates the Fermi energy (EF), but approximations in the theory and differences in choice of the experimental edge position mean that EF is usually refined.

2.2. Multiple scattering

EXCURVE calculates multiple scattering to fifth order, with up to five different atoms in the path. The theory of Gurman, Binsted and Ross (Gurman et al., 1986link to reference; Rehr & Albers, 1990link to reference; Zabinsky et al., 1995link to reference) or the small-atom theory (Gurman, 1988link to reference) may be used. The more accurate Gurman, Binsted and Ross theory relies on tables of coefficients and limits the maximum l value to 15 rather than 25. For a close-packed solid, many thousands of paths must be included to achieve convergence, and an efficient strategy is employed to make the calculation feasible. EXCURVE does not generate a list of possible paths in advance of the calculation, but calculates second-order and then third-order (etc.) paths using all possible combinations of shells (including the central atom `shells') and where necessary atoms within shells. This procedure exploits the point symmetry of each cluster of atoms (possibly several clusters, reflecting different crystallo­graphic sites for the central atom). For example, Oh symmetry path multiplicities may be as high as 192, resulting in considerable efficiencies. Other efficiencies include specifying a maximum path length, a minimum scattering angle or selecting the atoms used in the calculation, for example to only include atoms in certain ligands.

2.3. Treatment of disorder

If many-body effects are ignored, thermal and static disorder in EXAFS can be described in terms of pair distribution functions for each leg of a scattering path. In the harmonic approximation disorder is described approximately by a Debye–Waller factor, given by Mathematical symbol), where the mean-square variation in path length Mathematical symbol is given in units of Å2 (Beni & Platzman, 1976link to reference; Binsted et al., 2005link to reference).

For a single leg of a scattering path, in one dimension and assuming isotropic motion of individual atoms a and b, the contribution to Mathematical symbol is given by the mean-square relative displacement,Mathematical equationwhere Mathematical symbol is the mean-square displacement of atom a and Cab is a displacement correlation function. The Mathematical symbol are related to the crystallographic isotropic atomic temperature factor Biso byMathematical equationPhotoelectron propagation is orders of magnitude faster than thermal motion, so when a leg appears in a scattering path n times, the contribution to Mathematical symbol is n2 times that of an isolated leg. Thus, for a single scattering path (where the in and out legs are the same) in one dimension, and assuming isotropic atomic motion, Mathematical symbol is given byMathematical equationThe single-scattering Debye–Waller factor is thenMathematical equationwhere Aj is a refinable parameter which characterizes each shell j.

For multiple scattering paths, it is necessary to take the angle between the legs of the path into account. In EXCURVE it is assumed that Mathematical symbol is given byMathematical equation

The αa are the angles between the legs of the scattering path which meet at atom a (i.e. 0° for backscattering, 180° for forward scattering and, for example, 126° for the Zn—N1—C2 angle in Fig. 2link to figure, bottom left) and Cea is an effective correlation term that applies to atom a. n is the number of times that an atom occurs in a leg. Thus, for a linear chain of atoms 0–abcba–0 (where 0 is the central atom), Mathematical symbol will be identical to that of a single-scattering path 0–c–0. For the path 0–a–0–a–0–a–0, Mathematical symbol will be 25/4 times that of the value for the single-scattering path 0–a–0. When the path is nonlinear, however, the effective correlation terms for each atom, Cen, depend on the Mathematical symbol and Cnm of all of the other atoms m in the path. The mean-square displacement terms Mathematical symbol and correlation terms Cab in multiple-scattering paths are not treated as separate variables in EXCURVE, but are derived by partitioning the Aj parameters which define each shell for the atoms involved in the scattering path, thus avoiding an unwarranted increase in refinable parameters. The terms Mathematical symbol are therefore approximated using a sum over all the Aj values for atoms in the path, weighted according to the angles between the atoms (Binsted et al., 2005link to reference).

[Figure 2]

Figure 2

k3-weighted Zn K EXAFS (top), phase-shift-corrected Fourier transforms (middle, modulus and imaginary parts included) and averaged geometries from crystallography (bottom) of Zn–imidazole complexes. (a) Zn(imidazole)4 diperchlorate, (b) Zn(imidazole)2 bisacetate: experimental (blue grey) with simulation (red) based on the crystal structures (Bear et al., 1975link to reference; Horrocks et al., 1982link to reference). Adapted from Feiters et al. (2003link to reference) and Feiters & Meyer-Klaucke (2013link to reference).

Where one of the atoms in a path is highly polarizable, or one of the atoms in a lattice occupies an off-site position, the harmonic approximation may no longer be valid and it is then necessary to describe a pair distribution in terms of a cumulant expansion (Tranquada & Ingalls, 1983link to reference; Binsted et al., 2005link to reference). Using a one-dimensional expansion in the plane-wave approximation, this generates a phase term generated by the third cumulant (skewness) and an amplitude term given by the fourth cumulant (kurtosity). In addition, it gives an additional phase term due to the second cumulant (variance) that was disregarded in the initial description. The phase terms can be described as an apparent interatomic distance (r′) in the Hankel functions h(kr′). In terms of the cumulants of the interatomic distance, σ2σ3σ4, this givesMathematical equationand an amplitude termMathematical equationIf an additional option to include the effect of isotropic motion in three dimensions is included, the effective distance is further modified,Mathematical equationWhen using the cumulant expansion, shell parameters Bj are equivalent to 103σ3 and Cj are equivalent to 106σ4. There is also an option for evaluating the integral over the pair distribution function numerically.

3. Simulations, refinement and analysis methods

The usual input for EXAFS simulations is an experiment which has been background-subtracted and is usually presented as χ(k), with the energy axis converted from energy (E, in eV) to wavevector (k, in Å−1), usingMathematical equationwhere me is the mass of the electron, E0 is the edge energy and Mathematical symbol is h/2π. This choice of x axis has the advantage of showing the EXAFS oscillations as sinusoids. To offset the damping of the oscillations, the fine structure is often k3-weighted, so that the oscillations have a near-constant amplitude over the k range. The main ingredients for interpretation of EXAFS are the structural model and the phase shifts.

Simulations require a starting-model structure, which is typically based on prior chemical understanding of the system under study. Structural models can be built in EXCURVE in a number of ways: (i) shell by shell, defining atom type, occupancy, distance to absorber and the Debye–Waller parameter; (ii) by generating coordinates from shell parameters by defining the point symmetry of the cluster or from tabulated simple crystal structures (for example f.c.c., NaCl, CaF2); or (iii) by reading atomic coordinates from databases, including the Protein Data Bank (PDB) or using EXCURVE's built-in Ligand Database, which is based on the crystallo­graphic refinement program PROLSQ (Hendrickson, 1985link to reference). Multiple scattering is calculated in EXCURVE from `units', which typically contain one group of the structural model, or whole clusters, involving all atoms involved in the structural model, for example the imidazole group. It is also possible to read a PDB file, or build a structure in three dimensions, and assign it to a cluster. In this case the EXAFS, including multiple scattering, can be calculated in three dimensions and will include inter-unit multiple scattering as well as intra-unit multiple scattering terms.

A numerical indication of the quality of a simulation is the `fit index', which is a measure of the difference (φEXAFS) between the experimental and simulated spectrum over the whole data range; alternative indications of the goodness of fit are χ2 (Bunker et al., 1991link to reference) and the R factor (Binsted et al., 1992link to reference). For refinement guided by ideal geometric parameters, the fit index φ is defined as the sum of the contributions owing to deviations between experiment and theory (φEXAFS) and between refined and the idealized bond distances (φdist) and bond angles (φangle), respectively, for which the respective weightings wEXAFS, wdist and wangle can be adjusted,Mathematical equation

For every shell of backscattering atoms a reasonable choice is made of atom type and of the three most important parameters: the absorber–scatterer distance r, the shell occupancy N and the Debye–Waller parameter. EXAFS is calculated for a reasonably chosen ΔE0 (threshold energy, EF). The target for refinement is to seek agreement with the experimental EXAFS as defined by φEXAFS. Although it is good practice to check whether there is also good agreement with the real (modulus) as well as the imaginary component of the Fourier transform, it should be clear that no Fourier filtering is involved, and the fit index is only calculated for the EXAFS.

Simulations to find the best fit to the experimental data are performed by a process of `iterative refinement'. It is desirable to achieve an absolute minimum in the multidimensional parameter/fit-index space and false minima should be avoided by performing refinement from a different set of starting parameters. The results can be checked against the semi-empirical bond-valence sum approach (Thorp, 1992link to reference). It is also possible to produce a contour map of the fit index for a pair of parameters.

In single-scattering simulations, the parameters that are refined are ΔE0 (EF), the distances r and the Debye–Waller parameters. An important decision to be made is on the possible inclusion of an extra shell to the fit; criteria to take this decision have been defined (Joyner et al., 1987link to reference). For multiple-scattering simulations, the angle A (absorber)–B (backscatterer)–R (remote backscatterer) can also be refined for every R (remote) shell. For unknown systems the occupancy of each shell might also be refined. Generally, the number of refined parameters should be kept as low as possible to avoid overinterpretation of the data; it should always be less than the number of independent data points N(ind), which depends on the k and r range that are fitted (Stern, 1993link to reference),Mathematical equation

In multiple-scattering simulations, there is also a necessity to separately include the contributions of atoms in shells that may not be resolved in the Fourier transform, such as, for example, the two C atoms in the second shell of an imidazole ligand (Fig. 2link to figure) which have to be included separately with ABR angles of different signs.

In the case of heteroaromatic ligands, such as the haem or imidazole in biological systems (Fig. 2link to figure), a limit on the number of parameters used can be derived from the geometry of the multiple-scattering units. Parameters such as the distance of an imidazole, its rotation with respect to the metal–nitrogen bond and the distance of the metal with respect to the imidazole plane should be treated as real variables, while internal parameters, such as the distances between the atoms in the imidazole ring, should be constrained or restrained (Strange et al., 1987link to reference; Binsted et al., 1992link to reference).

In constrained refinement, the distances within the unit are fixed at ideal values imported from small-molecule crystallo­graphy, and the parameters refined are ΔE0, the angle for any unit, and one r and one Debye–Waller factor for every shell. This approach can be too rigid for many simulations, as can be seen from the differences (up to 0.04 Å shorter) going from Zn(imidazole)4 diperchlorate to Zn(imidazole)2 bisacetate in Fig. 2link to figure. Therefore restrained refinement is often used, whereby restraints for distances and angles are applied and the metal–unit atom distances are allowed to vary freely in the refinement. In deviations from the restraints, a weighted penalty is added to the fit index to keep the unit close to ideal geometry (Binsted et al., 1992link to reference). The Debye–Waller factors generally increase with the distance of the shell to the metal ion, and applying the same value to shells at similar distances in a single unit limits the number of parameters and increases the observation:parameter ratio. Fig. 2link to figure illustrates the accuracy of the EXAFS simulations in EXCURVE based on the crystallographic data, including the tilting of the imidazoles with respect to the Zn—N bond.

The introduction of constrained/restrained refinement procedures using idealized parameters was inspired by modelling methods in protein crystallography (Hendrickson & Konnert, 1980link to reference; Sussman et al., 1977link to reference; Engh & Huber, 1991link to reference), where such restraints are used for the refinement of structures against electron-density maps. 3D-EXAFS restrained refinements can be performed on metalloprotein crystal structure coordinates read by EXCURVE from the PDB. Examples include refining metal-site coordination to improved accuracy independent of the crystallographic resolution of azurin (Cheung et al., 2000link to reference) and vanadium-containing bromoperoxidase (Renirie et al., 2010link to reference). The combination of 3D-EXAFS and crystallography has also been used to improve the crystallographic modelling of N and O ligand atoms coordinated in the heavy-atom environments of the FeMo and VFe proteins of nitrogenase (Strange et al., 2003link to reference). It is also possible to simulate the EXAFS on the basis of multiple clusters where the element of interest occurs in very similar (different oxidation state) or very different (different physical phase) situations. Examples of the contributions of EXCURVE to biological applications of XAS are given in Strange (2024link to reference). EXCURVE has also found wide applications in materials, for example geology and environmental science (Helz et al., 1996link to reference; Farquhar et al., 2002link to reference; Little et al., 2014link to reference), and catalysis (Gruenert et al., 1994link to reference; Corker & Evans, 1994link to reference; Corker et al., 1996link to reference; Fiddy et al., 2007link to reference; Bauer et al., 2012link to reference; Santos et al., 2015link to reference; van Weerdenburg et al., 2015link to reference).

4. Conclusions

EXCURVE has attractive features for EXAFS specialists in different fields, such as the combination with powder diffraction for materials scientists and the ligand database and access to crystallographic data for molecular chemists and biochemists. The refinement is in k-space with no need for Fourier filtering. With the modern potential/phase-shift calculations, few parameters need to be adjusted in order to obtain good agreement between experiment and theory in the simulation of experimental data of a system for which the structure is already known.

On the availability: EXCURVE has moved from the CLRC/CCP3 context to Forge (https://ccpforge.cse.rl.ac.uk/gf/project/excurv/frs/ ) and is administrated by Barry Searle. The official site for DL-EXCURV is http://www.cse.scitech.ac.uk/cmg/EXCURV/ . The graphics in the standard version of the Daresbury Laboratory Visualize (DLV) package can be made to work on Linux or Cygwin.

Acknowledgements

The authors would like to acknowledge all who made scientific (Samar Hasnain, Steve Gurman, Greg Diakun, Manolis Pantos, Dave Norman and Neville Greaves) and programming (John Campbell, Paul Stephenson, Barry Searle and Stanko Tomic) contributions to the development of EXCURVE over many years. We have used material from introductions to EXCURVE given on various occasions by Loretta M. Murphy, John M. Charnock, Andrew J. Dent, J. Fred W. Mosselmans, Ian Harvey and Wolfram Meyer-Klaucke.

References

First citationAshley, C. A. & Doniach, S. (1975). Phys. Rev. B, 11, 1279–1288.Google Scholar
First citationBarth, U. von & Hedin, L. (1972). J. Phys. C Solid State Phys. 5, 1629–1642.Google Scholar
First citationBauer, M., Schoch, R., Shao, L., Zhang, B., Knop-Gericke, A., Willinger, M., Schlögl, R. & Teschner, D. (2012). J. Phys. Chem. C, 116, 22375–22385.Google Scholar
First citationBear, C. A., Duggan, K. A. & Freeman, H. C. (1975). Acta Cryst. B31, 2713–2715.Google Scholar
First citationBeni, G. & Platzman, P. M. (1976). Phys. Rev. B, 14, 1514–1518.Google Scholar
First citationBinsted, N., Edwards, A. B., Evans, J. & Weller, M. T. (2005). Phys. Scr. 2005, 155.Google Scholar
First citationBinsted, N. & Hasnain, S. S. (1996). J. Synchrotron Rad. 3, 185–196.Google Scholar
First citationBinsted, N., Pack, M. J., Weller, M. T. & Evans, J. (1996). J. Am. Chem. Soc. 118, 10200–10210.Google Scholar
First citationBinsted, N., Strange, R. W. & Hasnain, S. S. (1992). Biochemistry, 31, 12117–12125.Google Scholar
First citationBrink, D. M. & Satchler, G. R. (1968). Angular Momentum. Oxford University Press.Google Scholar
First citationBunker, G., Bunker, B. A., Crozier, D., Goulon, J., Gurman, S. J., Hasnain, S. S., Heald, S. M., Koningsberger, D. C., Natoli, R., Rehr, J. J. D., Sayers, D. & Udegawa, U. (1991). X-ray Absorption Fine Structure, edited by S. S. Hasnain, pp. 751–770. Chichester: Ellis Horwood.Google Scholar
First citationCheung, K.-C., Strange, R. W. & Hasnain, S. S. (2000). Acta Cryst. D56, 697–704.Google Scholar
First citationCitrin, P. H., Eisenberger, P. & Kincaid, B. M. (1976). Phys. Rev. Lett. 36, 1346–1349.Google Scholar
First citationClarke, L. J. (1984). Surface Crystallography. Chichester: John Wiley & Sons.Google Scholar
First citationClementi, E. & Roetti, C. (1974). At. Data Nucl. Data Tables, 14, 177–478.Google Scholar
First citationCorker, J., Lefebvre, F., Lécuyer, C., Dufaud, V., Quignard, F., Choplin, A., Evans, J. & Basset, J.-M. (1996). Science, 271, 966–969.Google Scholar
First citationCorker, J. M. & Evans, J. (1994). J. Chem. Soc. Chem. Commun., pp. 1027–1029.Google Scholar
First citationDesclaux, J. P. (1975). Comput. Phys. Commun. 9, 31–45.Google Scholar
First citationDurham, P. J. (1987). MUFPOT. SERC Daresbury Laboratory, UK.Google Scholar
First citationEngh, R. A. & Huber, R. (1991). Acta Cryst. A47, 392–400.Google Scholar
First citationFarquhar, M. L., Charnock, J. M., Livens, F. R. & Vaughan, D. J. (2002). Environ. Sci. Technol. 36, 1757–1762.Google Scholar
First citationFeiters, M. C., Eijkelenboom, A. P. A. M., Nolting, H.-F., Krebs, B., van den Ent, F. M. I., Plasterk, R. H. A., Kaptein, R. & Boelens, R. (2003). J. Synchrotron Rad. 10, 86–95.Google Scholar
First citationFeiters, M. C. & Meyer-Klaucke, W. (2013). Practical Approaches to Biological Inorganic Chemistry, edited by R. R. Crichton & R. O. Louro, pp. 131–160. Amsterdam: Elsevier.Google Scholar
First citationFiddy, S. G., Evans, J., Neisius, T., Newton, M. A., Tsoureas, N., Tulloch, A. A. D. & Danopoulos, A. A. (2007). Chem. Eur. J. 13, 3652–3659.Google Scholar
First citationFilipponi, A. & Di Cicco, A. (1995). Phys. Rev. B, 52, 15135–15149.Google Scholar
First citationFilipponi, A., Natoli, C. R. & Di Cicco, A. (2024). Int. Tables Crystallogr. I, ch. 6.11, 782–786 .Google Scholar
First citationFox, L. & Goodwin, E. T. (1949). Math. Proc. Camb. Philos. Soc. 45, 373–388.Google Scholar
First citationGruenert, W., Hayes, N. W., Joyner, R. W., Shpiro, E. S., Siddiqui, M. R. H. & Baeva, G. N. (1994). J. Phys. Chem. 98, 10832–10846.Google Scholar
First citationGurman, S. J. (1980). Notes on the EXAFS Programs at Daresbury Laboratory. DL Technical Memorandum DL/Sci/TM 21T. Warrington: Daresbury Laboratory.Google Scholar
First citationGurman, S. J. (1988). J. Phys. C Solid State Phys. 21, 3699–3717.Google Scholar
First citationGurman, S. J., Binsted, N. & Ross, I. (1984). J. Phys. C Solid State Phys. 17, 143–151.Google Scholar
First citationGurman, S. J., Binsted, N. & Ross, I. (1986). J. Phys. C Solid State Phys. 19, 1845–1861.Google Scholar
First citationGurman, S. J. & Pettifer, R. F. (1979). Philos. Mag. B, 40, 345–359.Google Scholar
First citationHedin, L. & Lundquist, S. (1969). Solid State Phys. 23, 1–181.Google Scholar
First citationHelz, G. R., Miller, C. V., Charnock, J. M., Mosselmans, J. F. W., Pattrick, R. A. D., Garner, C. D. & Vaughan, D. J. (1996). Geochim. Cosmochim. Acta, 60, 3631–3642.Google Scholar
First citationHendrickson, W. A. (1985). Methods Enzymol. 115, 252–270.Google Scholar
First citationHendrickson, W. A. & Konnert, J. H. (1980). Biophys. J. 32, 643–645.Google Scholar
First citationHerman, F. & Skillmann, S. (1963). Atomic Structure Calculations. Upper Saddle River: Prentice Hall.Google Scholar
First citationHorrocks, W. D. Jr, Ishley, J. N. & Whittle, R. R. (1982). Inorg. Chem. 21, 3265–3269.Google Scholar
First citationJoyner, R. W., Martin, K. J. & Meehan, P. (1987). J. Phys. C Solid State Phys. 20, 4005–4012.Google Scholar
First citationKas, J. J., Vila, F. D. & Rehr, J. J. (2024). Int. Tables Crystallogr. I, ch. 6.8, 764–769 .Google Scholar
First citationKoningsberger, D. C. & Prins, R. (1988). Editors. X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES. New York: Wiley.Google Scholar
First citationLee, P. A. & Beni, G. (1977). Phys. Rev. B, 15, 2862–2883.Google Scholar
First citationLee, P. A. & Pendry, J. B. (1975). Phys. Rev. B, 11, 2795–2811.Google Scholar
First citationLittle, S. H., Sherman, D. M., Vance, D. & Hein, J. R. (2014). Earth Planet. Sci. Lett. 396, 213–222.Google Scholar
First citationLu, D., de Leon, J. M. & Rehr, J. J. (1989). Physica B, 158, 413–414.Google Scholar
First citationMattheis, L. F. (1973). Phys. Rev. B, 8, 3719–3740.Google Scholar
First citationPendry, J. B. (1974). Low Energy Electron Diffraction: The Theory and Its Application to Determination of Surface Structure. New York: Academic Press.Google Scholar
First citationRahkonen, K. & Krause, K. (1974). At. Data Nucl. Data Tables, 14–2, 140–146.Google Scholar
First citationRavel, B. (2016). X-ray Absorption and X-ray Emission Spectroscopy, edited by J. A. van Bokhoven & C. Lamberti, pp. 281–302. Chichester: Wiley.Google Scholar
First citationRehr, J. J. & Albers, R. C. (1990). Phys. Rev. B, 41, 8139–8149.Google Scholar
First citationRehr, J. J., Albers, R. C., Natoli, C. R. & Stern, E. A. (1986). Phys. Rev. B, 34, 4350–4353.Google Scholar
First citationRehr, J. J., Mustre de Leon, J., Zabinsky, S. I. & Albers, R. C. (1991). J. Am. Chem. Soc. 113, 5135–5140.Google Scholar
First citationRenirie, R., Charnock, J. M., Garner, C. D. & Wever, R. (2010). J. Inorg. Biochem. 104, 657–664.Google Scholar
First citationSantos, V. P., Wezendonk, T. A., Jaén, J. J. D., Dugulan, A. I., Nasalevich, M. A., Islam, H.-U., Chojecki, A., Sartipi, S., Sun, X., Hakeem, A. A., Koeken, A. C. J., Ruitenbeek, M., Davidian, T., Meima, G. R., Sankar, G., Kapteijn, F., Makkee, M. & Gascon, J. (2015). Nat. Commun. 6, 6451.Google Scholar
First citationSayers, D. E., Stern, E. A. & Lytle, F. W. (1971). Phys. Rev. Lett. 27, 1204–1207.Google Scholar
First citationSlater, J. C. (1967). Insulators, Semiconductors and Metals. New York: McGraw-Hill.Google Scholar
First citationStern, E. A. (1974). Phys. Rev. B, 10, 3027–3037.Google Scholar
First citationStern, E. A. (1993). Phys. Rev. B, 48, 9825–9827.Google Scholar
First citationStern, E. A. (1988). X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES, edited by D. C. Koningsberger & R. Prins, pp. 3–52. New York: Wiley.Google Scholar
First citationStern, E., Sayers, D. E. & Lytle, F. W. (1975). Phys. Rev. B, 11, 4836–4846.Google Scholar
First citationStrange, R. W. (2024). Int. Tables Crystallogr. I, ch. 8.13, 1014–1021 .Google Scholar
First citationStrange, R. W., Blackburn, N. J., Knowles, P. F. & Hasnain, S. S. (1987). J. Am. Chem. Soc. 109, 7157–7162.Google Scholar
First citationStrange, R. W., Eady, R. R., Lawson, D. & Hasnain, S. S. (2003). J. Synchrotron Rad. 10, 71–75.Google Scholar
First citationSussman, J. L., Holbrook, S. R., Church, G. M. & Kim, S.-H. (1977). Acta Cryst. A33, 800–804.Google Scholar
First citationTeo, B. K. & Joy, D. C. (1981). Editors. EXAFS Spectroscopy: Techniques and Applications. New York: Plenum Press.Google Scholar
First citationTeo, B. K., Lee, P. A., Simons, A. L., Eisenberger, P. & Kincaid, B. M. (1977). J. Am. Chem. Soc. 99, 3854–3856.Google Scholar
First citationThorp, H. H. (1992). Inorg. Chem. 31, 1585–1588.Google Scholar
First citationTomic, S., Searle, B. G., Wander, A., Harrison, N. M., Dent, A. J., Mosselmans, J. F. W. & Inglesfield, J. E. (2004). New Tools for the Analysis of EXAFS: The DL_EXCURV Package. CCLRC Technical Report DL-TR-2005-001.Google Scholar
First citationTranquada, J. M. & Ingalls, R. (1983). Phys. Rev. B, 28, 3520–3528.Google Scholar
First citationWeerdenburg, B. J. A. van, Engwerda, A. H. J., Eshuis, N., Longo, A., Banerjee, D., Tessari, M., Guerra, C. F., Rutjes, F. P. J. T., Bickel­haupt, F. M. & Feiters, M. C. (2015). Chem. Eur. J. 21, 10482–10489.Google Scholar
First citationWellenreuther, G., Parthasarathy, V. & Meyer-Klaucke, W. (2010). J. Synchrotron Rad. 17, 25–35.Google Scholar
First citationZabinsky, S. I., Rehr, J. J., Ankudinov, A., Albers, R. C. & Eller, M. J. (1995). Phys. Rev. B, 52, 2995–3009.Google Scholar
First citationZare, R. N. (1988). Angular Momentum. New York: Wiley.Google Scholar








































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