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International
Tables for Crystallography Volume I X-ray absorption spectroscopy and related techniques Edited by C. T. Chantler, F. Boscherini and B. Bunker © International Union of Crystallography 2024 |
International Tables for Crystallography (2024). Vol. I. ch. 6.19, pp. 822-826
https://doi.org/10.1107/S1574870720003444 Chapter 6.19. Real-Space X-ray Absorption Package (RSXAP)aLawrence Berkeley National Laboratory, Berkeley, CA 94720, USA, and bPhysics Department, University of California, Santa Cruz, CA 95064, USA The Real-Space X-ray Absorption Package (RSXAP) is a robust collection of codes for analyzing EXAFS and XANES data. These codes do not use some of the common mathematical approximations employed in such analyses. In particular, a background-subtraction method is employed that properly normalizes transmission EXAFS data as a function of k, and the pair-distribution function g(r) is directly applied when calculating EXAFS fitting curves. Error analysis utilizes a profiling method that is less dependent on a quadratic surface of the statistical χ2 as a function of fitting parameters near its minimum. A brief and incomplete summary of the features of this package is presented, as well as a discussion of some of its limitations. Keywords: RSXAP. |
The Real-Space X-ray Absorption Package (RSXAP; Booth, 2016
) is a collection of data-reduction and fitting routines for analyzing both EXAFS and XANES data that grew out of the analysis codes of Hayes & Boyce (1982
). The programs currently only run on Unix- and Linux-based systems. The main routines for EXAFS are reduce and rsfit. Most programs can be run on batches of files for rapid processing. The guiding principle in these codes is to avoid certain approximations that are typically used in EXAFS analysis. For instance, a specific k-dependent background subtraction is performed that properly normalizes the data and does not require corrections to the Debye–Waller factors. Another example is that the usual k-space approximation of the effect of the pair-distribution variance, exp(−2k2σ2), is not used in favour of directly applying a pair-distribution function g(r), typically a Gaussian, in r-space. These and other important aspects of the methodology are discussed below.
The descriptions below focus on the reduce and rsfit programs, but many other codes are included in RSXAP for performing tasks such as converting data to RSXAP format, performing dead-time corrections (see, for example, Kappen et al., 2024
), performing energy calibrations etc. Table 1
lists some of the most-used auxiliary programs. Some highlights include codes that also allow self-absorption corrections (Booth & Bridges, 2005
), either within reduce or from the standalone code sabcor (Bridges & Booth, 2024
), an F-test (Downward et al., 2007
) with the standalone code hamilton or partially automated for individual scattering shells from within rsfit (Booth, 2024a
), and an iterative technique for the determination of μ0(E) (Bridges et al., 1995
), among many other features.
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The program reduce allows data reduction from e-space to k-space and r-space by pre- and post-edge subtractions. There are several methods for determining various options, and only some are discussed here. It is important to note that the pre-edge subtraction method used by reduce to remove all unwanted background absorption processes from transmission data gives a proper energy-dependent normalization such that no so-called `McMaster corrections' (see Rehr et al., 1991
) are required to obtain accurate Debye–Waller factors (Li et al., 1995
). The importance of this normalization and the accuracy of the Debye–Waller factors obtained by this method are not generally appreciated by all EXAFS practitioners, and so we describe it more fully here. Pre-edge subtraction is accomplished for transmission data by constructing a function μpre(E) such that the absorption due to the atomic edge of interest, μe(E) = μ(E)t − μpre(E)t, above the threshold energy E0 generally follows the energy dependence expected from a Victoreen formula (Victoreen, 1949
). This is accomplished by automatically determining the step height at E0, Δμe(E0), by extrapolating linear fits in the pre- and post-edge regions to the energy at the half-height of the edge step, defining E0. The Victoreen values μvic(E) for the absorption of the given edge are determined above the edge from standard tables (Teo, 1986
). A function fpre(E) is then defined differently above and below the edge. For E < E1,and for E > E2,
where E1 and E2 define a range around the edge that is not used in the fit. The final μpre(E)t function is then typically determined by a fourth-order polynomial fit through fpre(E). This procedure is portrayed in Fig. 1
, where μe is seen to be about 75% of Δμe(E0) at 1 keV above the edge.
Pre-edge subtractions for fluorescence data do not use tabulated absorption data, since the fluorescence efficiency is also a function of E. In addition, the progression of the measured fluorescence flux, If(E), is itself a strong function of the angle of the sample with respect to the beam and the detector [see Bridges & Booth (2024
) on self-absorption corrections]. Fortunately, modern fluorescence detectors can often discriminate against absorption processes outside the edge of interest, and in these cases one need only fit the pre-edge data to a constant and subtract it. Other empirical methods are used when background fluorescence processes affect the measured data, and are discussed in the documentation.
Available methods to determine the post-edge atomic background function μ0(E) each use polynomial or spline fits, but there are many options. Spline knots can be at fixed intervals in some power of E, or the knots can be allowed to vary in energy. In both spline and polynomial fits the data can be weighted in different ways, such as increasing the weight by a power of E or forcing the data through the first data point in the fit range (Emin) or another data point of the investigator's choosing (Efix). Other function options exists. Once a function is determined, typically Emin (and sometimes Efix, if used) is allowed to vary such that the low-r part of the modulus of the Fourier transform (FT) is either minimized, fits best to a line or fits best to a quadratic function. Minimizing the modulus works best for systems with relatively far nearest neighbours, such as a metal, and a quadratic function works best for systems with close nearest neighbours, such as an oxide.
Using the low-r part of a transform as an indicator of the quality of the determination of μ0 is effective, but some atomic backgrounds have features that can limit the effectiveness of such a method, such as those due to so-called `atomic EXAFS' (AXAFS; Rehr et al., 1994
) and multielectron excitations (Filipponi et al., 1988
; Li et al., 1992
; D'Angelo et al., 1996
; Gomilšek et al., 2009
). In this case, a theoretical model of the EXAFS can be employed to obtain better estimates of μ0. The method employed in RSXAP (Bridges et al., 1995
) is to perform an iterative procedure where a first-guess estimate of μ0 is made using the techniques just described, followed by a shell fit to the data. The fit residual is then generated in e-space and a new estimate of μ0 is made by fitting to this residual. The process is iterated until a satisfactory fit to the Fourier transform of the data is obtained.
All EXAFS fitting using rsfit is performed in r-space. Furthermore, unlike many other EXAFS fitting routines, the pair-distribution function g(r) is applied and numerically convolved to obtain the final fitting function, allowing the actual Gaussian or any other form to be used rather than using the k-space exp(−2σ2k2) approximation, typically asThe convolution can be applied either in k-space or in r-space. In k-space, one may write χ(k) as a sum over shells ns as
where a standard EXAFS curve
for a given scattering (or multiple scattering) path i at a distance R′ is given by
C3,i and C4,i are the third and fourth cumulants as described in Bunker (1983
), Tranquada & Ingalls (1983
) and Yang et al. (1977
). Note that the second cumulant term that is normally present in the argument of the sine term of a k-space formulation is missing in equation (5)
, since it is already included by explicitly integrating the Gaussian with the 1/R2 term (equation 4
) in this r-space formulation (Hayes & Boyce, 1982
). Threshold energy shifts ΔE0,i are included by defining the wavevector k = [k′2 − (2me/ℏ2)E0,i]1/2, where k′ is the original wavevector of the standard curve. The standard curve can either be from an experimental standard or from a code such as FEFF (Rehr et al., 2010
; Kas et al., 2024
), in which case a single value of ΔE0 for all paths is generally used. χ(k) can then be Fourier-transformed to r-space, where W(k) is a window function that accounts for the transform range (RSXAP uses a Gaussian-rounded window function).
The methodology employed in RSXAP reverses the order of the integration over R′ in equation (4)
and the FT in equation (6)
. In this case, the core fit function is written aswhere
is the FT of the standard
,
Note that the factor |Fi(k, R′)| implicitly includes any polarization dependence. A nice feature of this methodology is the easy and explicit R′ dependence of
, which is trivially shifted in r when calculating a sample fit function in equation (7)
. It is important to note that the Fourier transform is a complex function with a real and imaginary part. The quality-of-fit (residual) parameter
is defined as
where
and
are the real and imaginary parts of the FT of the data using the same W(k) as the similar fit function parts
and
.
The factor is minimized using the fitting routine STEPIT and uncertainties determined by FIDO (Chandler, 1965
). As such, no derivatives are necessary or calculated. To estimate the parameter uncertainties, the parameter in question pi is varied while holding all other parameters fixed until the statistical χ2 is increased by unity, as described in Booth (2024a
) and Booth & Hu (2009
). This method not only allows better uncertainty estimates in complicated fitting landscapes where the assumption that the statistical χ2 is quadratic near its minimum is poor, but also naturally allows asymmetric uncertainties, such as are commonly observed for σ2 parameters.
While RSXAP features accurate background-removal and fitting methodologies and is quite flexible, there are several limitations that make these codes difficult to use and employ, and some functionalities that are not included.
Regarding the methodology, multiple scattering can only be included by treating it as a separate standard curve , which is typically obtained theoretically. For instance, when using FEFF one can create a standard curve for a set of multiple-scattering paths by summing various paths together when creating a given
. In this manner, the path can only be varied within the fit by varying the overall bond-length, Debye–Waller and other fitting parameters. A better method would be to recalculate the multiple scattering when bond-length changes are made in the fit. The codes do have a flexible constraint system that can be used to mimic certain types of multiple scattering, for instance constraining the effective bond length of the four-leg U–O–U–O scattering of an isolated U–O pair to be twice the U—O bond length.
As far as usability and portability are concerned, the codes only compile on Linux- and Unix-based systems, although much of the code now compiles under Windows as well. Although there is a graphical user interface, for complete functionality a text-based menu system is utilized that can be executed quite rapidly by experienced users. The routines are, however, very difficult to use for inexperienced investigators.
A missing functionality that may be added in the future is the ability to simultaneously fit multiple data files with shared fitting parameters. Another missing feature is to automate the iterative background technique (Bridges et al., 1995
).
As an example of a fit to EXAFS data using RSXAP, we present the data and fit results for a copper-doped ZnS nanocrystal phosphor described in full elsewhere (Car et al., 2011
). This example is for illustrative purposes only and is not meant to be a complete report of these data and fits.
The Cu K-edge data were collected at 10 K on beamline 10-2 at the Stanford Synchrotron Radiation Lightsource (SSRL) using detuned Si(111) monochromator crystals. The error bars were calculated from five scans. This simple fit model assumes only one scattering shell, with the backscattering amplitudes and phases calculated by FEFF6 (Zabinsky et al., 1995
). Other fit models are considered in Car et al. (2011
). The main question to resolve is how the copper substitutes into the ZnS lattice.
The fits were performed using two methods for calculating the statistical χ2. Other methods are possible, and in fact parameter errors were obtained from individual fits of the five scans in Car et al. (2011
). Here, the `statistical χ2' method minimizes a χ2 function based on equation (1) in Booth (2024a
), where the individual errors per data point in r-space, ei, are determined by the distribution per data point of the five measured scans. In the `single e' method, all ei = e, with e chosen such that χ2 = ν, where ν represents the degrees of freedom of the the fit (see Booth, 2024a
,b
). The data and fit using the χ2 method are shown in Fig. 2
in both k-space and r-space, and the results for both methods are reported in Table 2
.
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In this case, the estimated errors are similar between the two methods, but the `single e' method gives more conservative error estimates, which is generally the case due to the enhancement of the statistical χ2 from systematic uncertainties (Booth, 2024b
). Note that while asymmetric errors are calculated, only the larger of the two errors is reported.
The near-neighbour coordination has four sulfur neighbours around zinc at a distance of 2.34 Å. The fit results in Table 2
are not consistent with a simple substitution of Cu for Zn atoms in this structure. In fact, copper has a reduced coordination of about 3.2 ± 0.2 neighbours at a distance of 2.27 ± 0.01 Å. A model is discussed in Car et al. (2011
) that rationalizes these results with an off-centre displacement of the Cu atom within the sulfur tetrahedron in the presence of a sulfur vacancy.
Acknowledgements
Portions of this work were supported by the US Department of Energy (DOE), Office of Science (OS), Office of Basic Energy Sciences (OBES) under Contract No. DE-AC02-05CH1123. EXAFS data were collected at the Stanford Synchrotron Radiation Lightsource, which is supported by the US DOE, OS, OBES under contract No. DE-AC01-76SF00515.
References
Booth, C. H. (2016). RSXAP Analysis Package. http://lise.lbl.gov/RSXAP/
.Google Scholar
Booth, C. H. (2024a). Int. Tables Crystallogr. I, ch. 5.8, 672–675
.Google Scholar
Booth, C. H. (2024b). Int. Tables Crystallogr. I, ch. 5.9, 676–677
.Google Scholar
Booth, C. H. & Bridges, F. (2005). Phys. Scr. 2005, 202.Google Scholar
Booth, C. H. & Hu, Y.-J. (2009). J. Phys. Conf. Ser. 190, 012028.Google Scholar
Bridges, F. & Booth, C. H. (2024). Int. Tables Crystallogr. I, ch. 3.44, 564–566
.Google Scholar
Bridges, F., Booth, C. H. & Li, G. G. (1995). Physica B, 208–209, 121–124.Google Scholar
Bunker, G. (1983). Nucl. Instrum. Methods Phys. Res. 207, 437–444.Google Scholar
Car, B., Medling, S., Corrado, C., Bridges, F. & Zhang, J. Z. (2011). Nanoscale, 3, 4182–4189.Google Scholar
Chandler, J. P. (1965). STEPIT and FIDO. Quantum Chemistry Exchange Program, Department of Chemistry, Indiana University, Bloomington, USA.Google Scholar
D'Angelo, P. H.-F., Nolting, H. & Pavel, N. V. (1996). Phys. Rev. A, 53, 798–805.Google Scholar
Downward, L., Booth, C. H., Lukens, W. W. & Bridges, F. (2007). AIP Conf. Proc. 882, 129–131.Google Scholar
Filipponi, A., Bernieri, E. & Mobilio, S. (1988). Phys. Rev. B, 38, 3298–3304.Google Scholar
Gomilšek, J. P., Arčon, I., de Panfilis, S. & Kodre, A. (2009). Phys. Rev. A, 79, 032514.Google Scholar
Hayes, T. M. & Boyce, J. B. (1982). Solid State Phys. 37, 173–351.Google Scholar
Kappen, P., Wykes, J. & Johannessen, B. (2024). Int. Tables Crystallogr. I, ch. 3.37, 528–536
.Google Scholar
Kas, J. J., Vila, F. D. & Rehr, J. J. (2024). Int. Tables Crystallogr. I, ch. 6.8, 764–769
.Google Scholar
Li, G. G., Bridges, F. & Booth, C. H. (1995). Phys. Rev. B, 52, 6332–6348.Google Scholar
Li, G. G., Bridges, F. & Brown, G. S. (1992). Phys. Rev. Lett. 68, 1609–1612.Google Scholar
Rehr, J. J., Booth, C. H., Bridges, F. & Zabinsky, S. I. (1994). Phys. Rev. B, 49, 12347–12350.Google Scholar
Rehr, J. J., Kas, J. J., Vila, F. D., Prange, M. P. & Jorissen, K. (2010). Phys. Chem. Chem. Phys. 12, 5503.Google Scholar
Rehr, J. J., Mustre de Leon, J., Zabinsky, S. I. & Albers, R. C. (1991). J. Am. Chem. Soc. 113, 5135–5140.Google Scholar
Teo, B. K. (1986). EXAFS: Basic Principles and Data Analysis. New York: Springer-Verlag.Google Scholar
Tranquada, J. M. & Ingalls, R. (1983). Phys. Rev. B, 28, 3520–3528.Google Scholar
Victoreen, J. A. (1949). J. Appl. Phys. 20, 1141–1147.Google Scholar
Yang, D. S., Fazzini, D. R., Morrison, T. I., Tröger, L. & Bunker, G. (1997). J. Non-Cryst. Solids, 210, 275–286.Google Scholar
Zabinsky, S. I., Rehr, J. J., Ankudinov, A., Albers, R. C. & Eller, M. J. (1995). Phys. Rev. B, 52, 2995–3009.Google Scholar