International Tables for Crystallography
| Electron yield: total, Auger and photoemission International Tables for Crystallography (2024). Vol. I [ doi:10.1107/S1574870720008502 ] Abstract The depth sensitivity and collection efficiency of various electron-detection schemes for X-ray absorption fine structure are discussed with examples taken from the literature. Enhanced surface sensitivity is demonstrated with an example in which monolayer specificity from a single-crystal surface is achieved. |
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About International Tables for Crystallography
International Tables for Crystallography is the definitive resource and reference work for crystallography. The multi-volume series comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.