International Tables for Crystallography
| Energy-scanning and energy-dispersive spectrometers for XAFS International Tables for Crystallography (2024). Vol. I [ doi:10.1107/S1574870722003160 ] Abstract The main types of spectrometers currently used for XAFS measurements are described: energy-scanning and energy-dispersive spectrometers. The main characteristics and operation modes of each are provided. A critical assessment of their performance is also made with the aim of providing guidelines for the non-expert user, so that for a given scientific application, and depending on the specific technical requirements (energy resolution, time resolution etc.), an informed choice of the most appropriate spectrometer can be made. |
Access, prices and ordering
International Tables for Crystallography is available online as a full set of volumes through Wiley.
![]() |
If you have already registered and are using a computer listed in your registration details, please email [email protected] for assistance.
About International Tables for Crystallography
International Tables for Crystallography is the definitive resource and reference work for crystallography. The multi-volume series comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.
