International Tables for Crystallography
| Special considerations for insertion-device beamlines International Tables for Crystallography (2024). Vol. I [ doi:10.1107/S1574870722003986 ] Abstract Some special considerations that are needed for X-ray absorption fine-structure measurements at insertion devices are introduced. These include radiation damage, beam stabilization during energy scans and effects due to beam coherence. |
Access, prices and ordering
International Tables for Crystallography is available online as a full set of volumes through Wiley.
 |
If you have already registered and are using a computer listed in your registration details, please email [email protected] for assistance.
About International Tables for Crystallography
International Tables for Crystallography is the definitive resource and reference work for crystallography. The multi-volume series comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.