Reflection X-ray absorption fine structure (ReflXAFS) draws local structural information on near-surface layers from the fine structure of the reflectivity spectrum above an absorption edge. As reflectivity depends on both the real and the imaginary part of the refraction index of the sample, analysis of ReflXAFS data is not as straightforward as in the conventional case. Particular data-treatment procedures have been developed for a rigorous analysis, and a review of the proposed methods is presented in this chapter.