International Tables for Crystallography
| Surfaces and interfaces International Tables for Crystallography (2024). Vol. I [ doi:10.1107/S1574870720004711 ] Abstract The applications of XAFS to surfaces and interfaces are briefly reviewed and recent developments in time-resolved and spatially resolved in situ XAFS measurements are discussed not only for flat surfaces but also for the surfaces of nanoparticles that play important roles as catalysts. |
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About International Tables for Crystallography
International Tables for Crystallography is the definitive resource and reference work for crystallography. The multi-volume series comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.