Figure 4.3.8.6

Spence, J. C. H.; Cowley, J. M.

doi:10.1107/97809553602060000593

International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

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International Tables for Crystallography (2006). Vol. C. ch. 4.3, p. 426

Figure 4.3.8.6

J. C. H. Spence^l and J. M. Cowley^b ^‡

Figure 4.3.8.6

Structure image of a thin lamella of the 6H polytype of SiC projected along [110] and recorded at 1.2 MeV. Every atomic column (darker dots) is separately resolved at 0.109 nm spacing. The central horizontal strip contains a computer-simulated image; the structure is sketched at the left. [Courtesy of H. Ichinose (1994).]