International Tables for Crystallography (2006). Vol. C. ch. 4.1, pp. 186-190
https://doi.org/10.1107/97809553602060000591 |
Chapter 4.1. Radiations used in crystallography
Chapter index
Atomic beams 4.1.5.1
Atomic scattering factors 4.1.3
Continuous spectrum 4.1.4.1
de Broglie's law 4.1.2
Electron paramagnetic resonance 4.1.5.4
EPR (electron paramagnetic resonance) 4.1.5.4
EXAFS (extended X-ray absorption fine structure) 4.1.4.1
Extended X-ray absorption fine structure [(E)XAFS] 4.1.4.1
Hard X-rays 4.1.2.1
Infrared radiation 4.1.2.1
Laser plasma X-ray sources 4.1.4.1
Microwaves 4.1.5.4
Molecular beams 4.1.5.1
Mössbauer spectroscopy 4.1.4.1
Neutron sources
pulsed spallation 4.1.4.3
NMR (nuclear magnetic resonance) 4.1.5.4
Nuclear magnetic resonance (NMR) 4.1.5.4
Particle(s) 4.1.2
Photons 4.1.2
PIX (proton-induced X-ray analysis) 4.1.5.1
Planck's law 4.1.2
Positron annihilation spectroscopy (PAS) 4.1.5.2
Proton-induced X-ray analysis (PIX) 4.1.5.1
Pulsed (spallation) neutron source 4.1.4.3
Quanta 4.1.2
Raman spectroscopy 4.1.5.3
RBS (Rutherford backscattering) 4.1.5.1
Relativistic effects 4.1.2
Rotating-anode tubes 4.1.4.1
Rutherford backscattering (RBS) 4.1.5.1
Scattering lengths
for neutrons 4.1.3
Schrödinger wave equation 4.1.2
Soft X-rays 4.1.2.1
Spallation neutron sources 4.1.4.3
Wavevector 4.1.2
XAFS (extended X-ray absorption fine structure) 4.1.4.1
XPS (X-ray photoemission spectroscopy) 4.1.4.1
X-ray microscopy 4.1.4.1
X-ray photoemission spectroscopy (XPS) 4.1.4.1
X-ray source(s)
laser plasma 4.1.4.1
X-ray wavelengths 4.1.2.1