International Tables for Crystallography (2019). Vol. H, ch. 5.8, pp. 673-696
https://doi.org/10.1107/97809553602060000973

Chapter 5.8. Scattering methods for disordered heterogeneous materials

Contents

  • 5.8. Scattering methods for disordered heterogeneous materials  (pp. 673-696) | html | pdf | chapter contents |
    • 5.8.1. Introduction and overview  (pp. 673-675) | html | pdf |
      • 5.8.1.1. Amorphous and non-crystalline materials  (p. 673) | html | pdf |
      • 5.8.1.2. Disordered and heterogeneous (and multi-component) materials  (pp. 673-674) | html | pdf |
      • 5.8.1.3. Small-angle and wide-angle scattering tools  (p. 674) | html | pdf |
      • 5.8.1.4. Tabulated summary of quantitative information obtainable  (pp. 674-675) | html | pdf |
      • 5.8.1.5. Different notations  (p. 675) | html | pdf |
    • 5.8.2. Recommended measurement tools  (pp. 675-683) | html | pdf |
      • 5.8.2.1. Small-angle scattering using a position-sensitive detector  (pp. 675-677) | html | pdf |
      • 5.8.2.2. Ultra-small-angle scattering using crystal diffraction optics  (pp. 677-678) | html | pdf |
      • 5.8.2.3. Data reduction and calibration of small-angle scattering data  (pp. 678-680) | html | pdf |
        • 5.8.2.3.1. Reduction and calibration of 2D SAS data from a position-sensitive detector  (p. 679) | html | pdf |
        • 5.8.2.3.2. Reduction and calibration of 1D USAXS or USANS data  (p. 679) | html | pdf |
        • 5.8.2.3.3. Corrections for multiple scattering and flat background  (pp. 679-680) | html | pdf |
      • 5.8.2.4. Reflectivity, grazing-incidence small-angle scattering and diffraction  (pp. 680-681) | html | pdf |
      • 5.8.2.5. Wide-angle scattering and other methods for disordered structures  (pp. 681-683) | html | pdf |
    • 5.8.3. Quantitative analysis of disordered heterogeneous materials  (pp. 683-692) | html | pdf |
      • 5.8.3.1. Interpretative models for analysis of SAS data  (pp. 683-691) | html | pdf |
        • 5.8.3.1.1. Guinier approximation  (p. 683) | html | pdf |
        • 5.8.3.1.2. Porod scattering regime  (p. 683) | html | pdf |
        • 5.8.3.1.3. Scattering invariant  (p. 683) | html | pdf |
        • 5.8.3.1.4. Debye–Bueche model  (p. 683) | html | pdf |
        • 5.8.3.1.5. Shape effects in the form factor  (pp. 683-685) | html | pdf |
        • 5.8.3.1.6. Particle pair density distribution function (PDDF)  (pp. 685-686) | html | pdf |
        • 5.8.3.1.7. Size distribution analysis  (pp. 686-687) | html | pdf |
        • 5.8.3.1.8. Particle structure factor and interparticle interference effects  (p. 687) | html | pdf |
        • 5.8.3.1.9. Fractal models  (pp. 687-688) | html | pdf |
        • 5.8.3.1.10. Anomalous SAXS and contrast-variation SANS  (pp. 688-689) | html | pdf |
        • 5.8.3.1.11. Magnetic SANS analysis  (pp. 689-690) | html | pdf |
        • 5.8.3.1.12. Further analysis of X-ray reflectivity and GI-SAXS  (pp. 690-691) | html | pdf |
      • 5.8.3.2. Small-angle scattering effects on wide-angle scattering analysis  (p. 691) | html | pdf |
      • 5.8.3.3. Combining information from different methods  (pp. 691-692) | html | pdf |
    • 5.8.4. Prospects for future development and recommended further reading  (pp. 692-693) | html | pdf |
      • 5.8.4.1. Developments at X-ray synchrotron facilities  (p. 692) | html | pdf |
      • 5.8.4.2. Developments at steady-state and pulsed neutron sources  (pp. 692-693) | html | pdf |
      • 5.8.4.3. Future prospects  (p. 693) | html | pdf |
      • 5.8.4.4. Further reading  (p. 693) | html | pdf |
    • References | html | pdf |
    • Figures
      • Fig. 5.8.1. Examples of scattering methods applied to disordered, heterogeneous materials, together with the scale ranges of interest and the applicable scattering-based methods  (p. 673) | html | pdf |
      • Fig. 5.8.2. (a) Schematic of the basic measurement geometry for SAXS or SANS using a 2D PSD  (p. 675) | html | pdf |
      • Fig. 5.8.3. (a) Schematic of a typical USAXS instrument with regular 1D (slit-smeared) measurement configuration  (p. 677) | html | pdf |
      • Fig. 5.8.4. Schematic of typical USANS configuration at a reactor-based neutron source: s = sample, PG = pyrolitic graphite  (p. 678) | html | pdf |
      • Fig. 5.8.5. (a) Schematic of basic reflectivity measurement geometry for XRR or NR  (p. 680) | html | pdf |
      • Fig. 5.8.6. (a) Schematic of typical total-scattering [S(Q) − 1] data versus Q for model Au core–shell nanoparticles  (p. 682) | html | pdf |
      • Fig. 5.8.7. Characteristic SAS intensity profiles of ensembles of scattering features, both monodispersed and polydispersed in size  (p. 684) | html | pdf |
    • Tables
      • Table 5.8.1. Information on disordered or heterogeneous material systems using scattering methods  (p. 674) | html | pdf |