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International
Tables for Crystallography Volume I X-ray absorption spectroscopy and related techniques Edited by C. T. Chantler, F. Boscherini and B. Bunker © International Union of Crystallography 2024 |
International Tables for Crystallography (2024). Vol. I. ch. 6.23, pp. 843-847
https://doi.org/10.1107/S1574870720003481 Chapter 6.23. xafsX: a program to process, analyse and reduce X-ray absorption fine-structure spectraaNanoparticle Process Technology, University of Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany xafsX is a terminal/command-based interactive data-analysis program to process, analyse and reduce X-ray absorption fine-structure spectra, including XANES (X-ray absorption near-edge structure) and EXAFS (extended X-ray absorption fine structure). The Fortran code runs on UNIX-based operating systems such as Linux and MacOSX. xafsX contains empirical line-shape analysis of pre-edge and XANES data as well as standard analysis of EXAFS data based on FEFF amplitude and phase functions, including a variety of methods especially for analysing disordered systems. Keywords: xafsX; EXAFS; XANES; data processing; data reduction. |
The xafsX program allows the data analysis of XANES and EXAFS spectra, focusing on disordered solid systems such as glasses or amorphous and nanocrystalline materials. More elaborate methods such as reverse Monte Carlo modelling (Winterer, 2000
, 2002
; Winterer et al., 2002
; Djenadic et al., 2010
; Kompch et al., 2015
) need xafsX as a data-processing and reduction tool. Originally, the xafsX code was developed for pre-Mac OS X and UNIX systems and described as xafs at the Ninth International Conference on X-ray Absorption Fine Structure in Grenoble, France, in 1996 (Winterer, 1997
; Winterer et al., 1997a
).
xafsX is an intuitive terminal/command-based interactive program to process, analyse and reduce X-ray absorption fine structure spectra, including XANES and EXAFS (see Fig. 1
for an overview). The data analysis was developed by implementing most of the methods described in Teo (1986
), Bianconi (1988
) and especially Sayers & Bunker (1988
) and Crozier et al. (1988
).
The code relies on singular value decomposition and Levenberg–Marquardt linear and nonlinear least-squares fitting routines (Press et al., 1986
; Bevington, 1969
). xafsX allows the data range to be selected, old parameters to be read, data to be simulated, parameters to be kept variable or fixed and parameter values to be correlated and confined. The user may select different modes to compute the error/data weight and other fit control parameters. Data analysis is facilitated in most cases by estimated initial values supplied automatically. All data-analysis steps are automatically displayed using gnuplot (Williams & Kelley, 1986
) called directly from xafsX (using a subroutine published by Mahaffy, 1995
; see Fig. 2
). All resulting fitting parameters are automatically saved and can be used as input to simulate data or as initial values for fitting. The most important parameters determined are included in the header of the output files.
In the following, we use Co K-edge XAFS data of nanocrystalline ZnO doped with 20 atom% Co (Djenadic et al., 2010
) as an illustrative example. X-ray absorption spectra were obtained using beamline 12-BM-B at the Advanced Photon Source (APS). The absorption of the samples was optimized by diluting appropriate amounts homogeneously into starch powder and pressing a pellet uniaxially. Transmission spectra were collected at ambient temperature.
All input and output data are column-oriented text files (ASCII code). xafsX contains a convenient, versatile data-import tool which facilitates user-defined column and header formats, including the importing and averaging of multiple data sets and the averaging of data from multiple fluorescence detectors. Available column data types are energy (eV or keV) or any abcissa, reference (I0), transmission (I1), fluorescence (I1), single channel, multiple averaged fluorescence (I1), calibration standard (I2), absolute error, xafs [for example ln(I0/I1)] or any ordinate. Corresponding file formats are saved for further use. If original signals are imported, errors are estimated according to Lee et al. (1981
). Additionally, simulated FEFF data (Ankudinov et al., 1998
; Kas et al., 2024
) can be imported either as phase and amplitude (from feff####.dat files) or EXAFS signal (from chi.dat files).
Data-preparation (preprocessing) tools contain deglitching, data rebinning and pre-edge analysis using a Victoreen (transmission data) or polynomial fit (fluorescence data). Data rebinning improves the signal-to-noise ratio at the cost of resolution.
The post-edge background subtraction is also performed empirically using either a spline function after subtraction of the edge (determined in the XANES fit) including white lines or alternatively (default) by a combination of an error function (for the absorption edge up to a chosen k value, the default value is 3 Å−1) and a cubic spline. This improves the spline fit considerably as the steep absorption edge is already fitted and taken care of in the prior XANES fit.
Arithmetic operations on spectra are included to perform, for example, Δμ XANES analysis or extraction of partial signals such as atomic XAFS (Ramaker & Koningsberger, 2010
). This tool uses mapping of a second data-set abscissa to a data set chosen first by cubic spline interpolation; it allows a constant shift in abscissa and adjustment of the amplitude of the second data set.
XANES data analysis in xafsX is based on empirical line-shape functions. Besides spectroscopic information about pre-edge and edge features, this analysis provides reliable and reproducible values for the step height and position of the absorption edge. This is important for subsequent EXAFS data-analysis steps. Line-shape functions implemented for the absorption edge are arctangent, error function, a general step function (linear combination of arctangent and error function) and those for peak features are Lorentzian, Gaussian or pseudo-Voigt functions, as well as a Breit–Wigner–Fano function (Bianconi, 1988
).
In Fig. 2
the fit of the Co K-edge X-ray absorption spectrum of nanocrystalline ZnO doped with 20 atom% Co (Djenadic et al., 2010
) is displayed with a corresponding fit of pre-edge peak, step and XANES features. The `deconvolution' by line-shape analysis provides unambiguous information about the position and height of the absorption edge as well as pre-edge and XANES features (Table 1
).
|
EXAFS data analysis in xafsX can be performed using different empirical models: `standard' using the classical EXAFS formula (Sayers & Bunker, 1988
), `general' (including the third and fourth cumulant), `analytical distribution' (Crozier et al., 1988
), `numerical distribution' (histogram), cumulant analysis of phase and amplitude signals (Bunker, 1983
; Dalba et al., 1993
) and distribution reconstruction (splice method) (Crozier et al., 1988
). EXAFS data analysis is performed in k-space. Multiple scattering is not considered.
The analysis of the Co K-edge EXAFS signal of nanocrystalline ZnO doped with 20 atom% Co (Djenadic et al., 2010
) up to the second coordination shell (Table 2
, Figs. 3
and 4
) provides local structure information about the Co dopant which is identical within the estimated errors with analysis results obtained using ARTEMIS (Ravel & Newville, 2024
) or RMCXAS (Djenadic et al., 2010
) for the Co–O and Co–Zn contribution. In case of the (minor) Co–Co contribution to the second shell, this type of data analysis is at the limit since Co and Zn are difficult to distinguish as backscatterers. The large estimated errors in the Debye–Waller factor for the Co–Co contributions and the deviation in the Co–Zn coordination number are probably an artefact owing to the parameter correlation between NCo–Co and NCo–Zn used in the fit.
†As we cannot simultaneously analyse two spectra (here the Zn K edge as well), we used the parameter correlation NCo–Co = 12 − NCo–Zn.
|
Detailed analysis of the first shell using different methods (Table 3
) shows that higher than second moments do not contribute significantly to the distribution of the Co–O coordination distances in this sample. This Gaussian distribution is consistent with the moment analysis of the partial pair distribution function obtained by RMC analysis of the same data (Djenadic et al., 2010
). Deviations regarding the Co–O distance observed for the cumulant expansion and the general fit are likely to be due to probing different parts of the bond-distance distribution compared with other methods, since cumulant expansion and general fit include the third and fourth cumulants as fitting variables. This is likely to enlarge the flexibility of the fitting routine, although the higher cumulants remain insignificant. The rather small errors in the Co–O distance are a consequence of the single shell fits and the narrow Co–O distribution of Co substituting Zn in wurtzite-type ZnO.
†Parameters determined and errors estimated from Gaussian fits to the distributions.
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Together with results at the Zn K edge, the local structure shows that Co replaces Zn substitutionally in the wurtzite lattice, creating a solid solution of Co in ZnO consistent with X-ray diffraction and RMC data analysis (Djenadic et al., 2010
).
As an interactive program, xafsX leads the user step by step through data analysis and supports the user through estimates for (most) input parameters. xafsX contains a convenient, highly versatile data-import tool provided that the data are ASCII coded and column oriented, including averaging multiple columns from fluorescence detectors. xafsX allows good control of fitting procedures and saves all results automatically in separate files. In particular, xafsX provides accurate, reliable and reproducible data regarding edge position and step height owing to the empirical data analysis of the near-edge part of the spectrum not relying on finding maxima in noisy derivative signals and multiple spectral contributions and by providing different line-shape functions. Regarding the analysis of EXAFS data, different methods modelling distributions of bond distances are available, which is especially important for highly disordered systems.
The program has been used for data reduction and analysis of nanocrystalline materials (see, for example, Winterer et al., 1997
b), glasses (see, for example, Farges et al., 2001
) and geochemical/mineralogical samples (see, for example, Ona-Nguema et al., 2005
). Presently, it is mostly used for empirical pre-edge and XANES analysis, as well as data processing for EXAFS data refinement using more powerful codes such as RMCXAS (see, for example, Djenadic et al., 2010
; Kompch et al., 2015
) as well as analysis and postprocessing of the corresponding refinement results. xafsX is public domain and is available from the author by downloading from http://www.xafsx.de
after registration via e-mail. The compiled code for Unix-type operating systems is supplied with some test-data, readme and help files explaining most of the features and procedures.
Acknowledgements
The author gratefully acknowledges the discussion with and encouragement by Francois Farges. The author is grateful for all the beam time made available and supported by BNL, HASYLAB, SRS, BESSY, ANKA, APS, CLS, Diamond and especially their beamline scientists and technicians, and funding by the Alexander von Humboldt Foundation (AvH) and German Research Foundation (DFG).
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