International
Tables for Crystallography Volume C Mathematical, physical and chemical tables Edited by E. Prince © International Union of Crystallography 2006 |
International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 48
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The projected source width and receiving-slit width RSw each add a symmetrical broadening to the profiles that is constant for all angles. Both the profile width and the intensity increase with increasing take-off angle (Section 2.3.5). However, the contribution of is small when the line focus is used, Fig. 2.3.1.9(a) . The receiving slit can easily be changed and it is one of the most important elements in controlling the profile width, intensity, and peak-to-background ratio, as is shown in Figs. 2.3.1.9(a) and (c). Because of the contributions of other broadening factors, αRS can be about twice αF (line focus) without significant loss of resolution.
The projected width of the X-ray tube focus is given in equation (2.3.1.2). The aperture is For a line focus with actual width = 1 mm, ψ = 5°, and R = 185 mm, αF = 0.011°. The receiving-slit aperture is For RSw = 0.2 mm and R = 185 mm. αRS is 0.062°. The FWHM of the profiles is always greater than the receiving-slit aperture because of the other broadening factors.